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[null,"1.","Record Nr.",null,"UNINA990004342890403321"]
[null,null,"Autore",null,"Foner, Eric <1943- >"]
[null,null,"Titolo",null,"Tom Paine and revolutionary America / Eric Foner"]
[null,null,"Pubbl/distr/stampa",null,"New York : Oxford University press, 1976"]
[null,null,"Descrizione fisica",null,"XX, 326 p. : ill. ; 22 cm"]
[null,null,"Disciplina",null,"973.3092"]
[null,null,"Locazione",null,"FLFBC"]
[null,null,"Collocazione",null,"973.3 PAI 3"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910299468903321"]
[null,null,"Autore",null,"Yu Wenjian"]
[null,null,"Titolo",null,"Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits / / by Wenjian Yu, Xiren Wang"]
[null,null,"Pubbl/distr/stampa",null,"Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2014"]
[null,null,"ISBN",null,"3-642-54298-0"]
[null,null,"Edizione",null,"[1st ed. 2014.]"]
[null,null,"Descrizione fisica",null,"1 online resource (258 p.)"]
[null,null,"Disciplina",null,"003.3"]
[{"$nulls":4},"004"]
[{"$nulls":4},"518"]
[{"$nulls":4},"620"]
[null,null,"Soggetti",null,"Electronic circuits"]
[{"$nulls":4},"Computer-aided engineering"]
[{"$nulls":4},"Computer science - Mathematics"]
[{"$nulls":4},"Numerical analysis"]
[{"$nulls":4},"Computer simulation"]
[{"$nulls":4},"Circuits and Systems"]
[{"$nulls":4},"Computer-Aided Engineering (CAD, CAE) and Design"]
[{"$nulls":4},"Computational Science and Engineering"]
[{"$nulls":4},"Numerical Analysis"]
[{"$nulls":4},"Simulation and Modeling"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Introduction -- Basic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures."]
[null,null,null,"Sommario/riassunto","Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in "]
[{"$nulls":4},"nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA."]
[null,"3.","Record Nr.",null,"UNINA9910138812103321"]
[null,null,"Titolo",null,"Sankhyā . Series B"]
[null,null,"Pubbl/distr/stampa",null,"Calcutta, : Statistical Pub. Society, 1960-2002"]
[null,null,"Soggetti",null,"Statistics"]
[{"$nulls":4},"Statistique"]
[{"$nulls":4},"31.73 mathematical statistics"]
[{"$nulls":4},"Statistiek"]
[{"$nulls":4},"STATISTICAL METHODOLOGY"]
[{"$nulls":4},"Periodicals."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,null,null,"Note generali","\"The Indian journal of statistics.\""]
[{"$nulls":4},"Title from cover (JSTOR, viewed Dec. 5, 2008)."]
[{"$nulls":4},"Published by: Indian Statistical Institute, Dec. 1988-"]
[null,null,null,"Sommario/riassunto","\"Series B is mainly intended for analysis of original data of broad interest, novel applications of methodology and development of methods and techniques of immediate practical use\"--Foreword to Feb. 2003 issue."]