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[null,"1.","Record Nr.",null,"UNISALENTO991000707849707536"]
[null,null,"Autore",null,"Bachmann, Friedrich"]
[null,null,"Titolo",null,"Aufbau der Geometrie aus dem Spiegelungsbegriff / Friedrich Bachmann"]
[null,null,"Pubbl/distr/stampa",null,"Berlin : Springer-Verlag, 1973"]
[null,null,"ISBN",null,"3540061363"]
[null,null,"Edizione",null,"[2. ergantze Aufl]"]
[null,null,"Descrizione fisica",null,"xvi, 374 p. : ill. ; 24 cm."]
[null,null,"Collana",null,"Die Grundlehren der mathematischen Wissenschaften in Einzeldarstellungen mit besonderer Berücksichtigung der Anwendungsgebiete ; 96"]
[null,null,"Classificazione",null,"AMS 51-02"]
[{"$nulls":4},"AMS 51F"]
[{"$nulls":4},"AMS 51M"]
[null,null,"Disciplina",null,"516.9"]
[null,null,"Soggetti",null,"Modern geometry"]
[{"$nulls":4},"Reflection (Optics"]
[null,null,"Lingua di pubblicazione",null,"Tedesco"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Includes index."]
[{"$nulls":4},"\"Neuere Literatur\": p. [358]-365"]
[null,"2.","Record Nr.",null,"UNINA9910135266403321"]
[null,null,"Titolo",null,"ANSI/IEEE Std 661-1979 : IEEE standard method for determining objective loudness ratings of telephone connections / / Institute of Electrical and Electronics Engineers"]
[null,null,"Pubbl/distr/stampa",null,"Piscataway, New Jersey : , : IEEE, , 1979"]
[null,null,"ISBN",null,"0-7381-0563-5"]
[null,null,"Descrizione fisica",null,"1 online resource (20 pages)"]
[null,null,"Disciplina",null,"651.73"]
[null,null,"Soggetti",null,"Telephone systems"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Sommario/riassunto","To describe a practical and reproducible method of determining the loudness ratings of telephone connections. Loudness ratings may be measured directly using appropriate test instruments and facilities, as specified in this standard, or may be computed using the amplitude-frequency characteristic of the connection measured in accordance with IEEE Std 269-1971."]
[null,"3.","Record Nr.",null,"UNINA9910873998303321"]
[null,null,"Titolo",null,".. High Power Diode Lasers and Systems Conference"]
[null,null,"Pubbl/distr/stampa",null,"Piscataway, NJ : , : IEEE"]
[null,null,"Disciplina",null,"621.36"]
[null,null,"Soggetti",null,"Semiconductor lasers"]
[{"$nulls":4},"Diodes, Semiconductor"]
[{"$nulls":4},"Conference papers and proceedings."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,null,null,"Note generali","Proceedings of conference."]