{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":2,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":33,"n_cols":5,"rows_kept":33,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[9,2,9,3],[12,2,12,3],[13,2,13,3],[15,2,15,3],[15,4,15,5],[16,2,16,3],[16,4,16,5],[17,2,17,3],[17,4,17,5],[18,2,18,3],[20,2,20,3],[21,2,21,3],[22,2,22,3],[23,2,23,3],[24,2,24,3],[25,2,25,3],[27,2,27,3],[28,2,28,3],[31,2,31,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA990004981360403321"]
[null,null,"Titolo",null,"La linguistique catalane : colloque international organisé par le Centre de philologie et de littératures romanes de l'Université de Strasbourg du 23 au 27 avril 1968 / actes publiés par Antonio Badía Margarit et Georges Straka"]
[null,null,"Pubbl/distr/stampa",null,"Paris : Klincksieck, 1973"]
[null,null,"ISBN",null,"2-252-01480-6"]
[null,null,"Descrizione fisica",null,"461 p. ; 23 cm"]
[null,null,"Collana",null,"Actes et colloques ; 11"]
[null,null,"Disciplina",null,"449"]
[null,null,"Locazione",null,"NAP03"]
[{"$nulls":4},"FLFBC"]
[null,null,"Collocazione",null,"XC 41"]
[{"$nulls":4},"449.9 CONV STRASBURGO 1968"]
[{"$nulls":4},"CO 110"]
[null,null,"Lingua di pubblicazione",null,"Francese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910678248803321"]
[null,null,"Autore",null,"Ito Kodo"]
[null,null,"Titolo",null,"Optimal inspection models with their applications / / Kodo Ito and Toshio Nakagawa"]
[null,null,"Pubbl/distr/stampa",null,"Cham, Switzerland : , : Springer, , [2023]"]
[{"$nulls":4},"©2023"]
[null,null,"ISBN",null,"3-031-22021-8"]
[null,null,"Edizione",null,"[1st ed. 2023.]"]
[null,null,"Descrizione fisica",null,"1 online resource (266 pages)"]
[null,null,"Collana",null,"Springer Series in Reliability Engineering Series"]
[null,null,"Disciplina",null,"670.425"]
[null,null,"Soggetti",null,"Engineering inspection"]
[{"$nulls":4},"Reliability (Engineering)"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,null,"Nota di contenuto",null,"1. Introduction -- 2. Standard Inspection Models -- 3. Random Inspection Models -- 4. General Inspection Models -- 5. Inspection Models with Minimal Repair -- 6. Hierarchical Structure Reliability -- 7. Application Examples of Storage System -- 8. Application Examples of Phased Array Radar -- 9. Application Examples of Power Generator -- 10. Application Examples of Airframe -- 10.A Appendix -- A. Answer to Selected Problems. ."]
[null,null,null,"Sommario/riassunto","This book surveys recent applications of inspection models, maintenance models and cumulative damage models, as well as discusses the policies involved with these models. It explains how a stochastic approach can be applied to systems using real-world examples. The book begins by introducing and summarizing standard inspection models. It dedicates chapters to random inspection models and general inspection models, before moving on to discuss inspection policies and checkpoint models. The book discusses inspection of reliability systems, such as missile maintenance systems, as well as Markov models of inspection. The book concludes with a summary of other inspection models, problems they face, and solutions to these problems. Each chapter utilizes examples to illustrate the various models, methods, and policies. This book is of interest to engineering students, researchers, and design and production engineers working in system manufacturing."]