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[null,"1.","Record Nr.",null,"UNINA990000059800403321"]
[null,null,"Autore",null,"Navier, Claude-Louis-Marie-Henri"]
[null,null,"Titolo",null,"Rapporto e memoria sui ponti pensili / di L. Navier ; versione italiana con note ed aggiunte per cura di G. Corti"]
[null,null,"Pubbl/distr/stampa",null,"Milano, : Presso Angelo Monti Librajo, 1840"]
[null,null,"Descrizione fisica",null,"4 v. : ill. ; 29 cm"]
[null,null,"Collana",null,"Scelta biblioteca dell'ingegnere civile ; 19"]
[null,null,"Disciplina",null,"624.2"]
[null,null,"Locazione",null,"FINBC"]
[null,null,"Collocazione",null,"13 AR 2 B 12"]
[{"$nulls":4},"13 AR 2 B 13"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910699726803321"]
[null,null,"Autore",null,"Sarney Wendy L"]
[null,null,"Titolo",null,"Sample preparation procedure for TEM imaging of semiconductor materials [[electronic resource] /] / by Wendy L. Sarney"]
[null,null,"Pubbl/distr/stampa",null,"Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2004]"]
[null,null,"Descrizione fisica",null,"1 online resource (iv, 10 pages) : illustrations"]
[null,null,"Collana",null,"ARL-TR ; ; 3223"]
[null,null,"Soggetti",null,"Semiconductors - Sampling - United States"]
[{"$nulls":4},"Transmission electron microscopy"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Title from title screen (viewed on Dec. 3, 2010)."]
[{"$nulls":4},"\"June 2004.\""]
[{"$nulls":4},"000688067"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]