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[null,"1.","Record Nr.",null,"UNINA990000037410403321"]
[null,null,"Autore",null,"Leroy, Charles François Antoine <1780-1854>"]
[null,null,"Titolo",null,"Sugl'ingranaggi : appendice alla geometria descrittiva / del signor Leroy"]
[null,null,"Pubbl/distr/stampa",null,"Napoli : dalla Reale Tipografia Militare, 1844"]
[null,null,"Descrizione fisica",null,"68 p., 8 c. di tav. : ill. ; 22 cm"]
[null,null,"Disciplina",null,"621.833"]
[null,null,"Locazione",null,"FARBC"]
[{"$nulls":4},"FINBC"]
[null,null,"Collocazione",null,"RARI B 623 (2)"]
[{"$nulls":4},"13 AR 16 C 33"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA990005275840403321"]
[null,null,"Autore",null,"Stella, Aldo <1923-2007>"]
[null,null,"Titolo",null,"Anabattismo e antitrinitarismo in Italia nel 16. secolo : nuove ricerche storiche / Aldo Stella"]
[null,null,"Pubbl/distr/stampa",null,"Padova : Liviana, 1969"]
[null,null,"Descrizione fisica",null,"VI, 325 p. : 14 ill. ; 24 cm"]
[null,null,"Collana",null,"Biblioteca di cultura"]
[null,null,"Disciplina",null,"284.3"]
[null,null,"Locazione",null,"FLFBC"]
[null,null,"Collocazione",null,"284.3 STE 1"]
[{"$nulls":4},"284.3 STE 1 BIS"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"3.","Record Nr.",null,"UNINA9910809297503321"]
[null,null,"Titolo",null,"Low voltage electron microscopy : principles and applications / / edited by David C. Bell and Natasha Erdman"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, : John Wiley & Sons Inc., 2013"]
[null,null,"ISBN",null,"9781118498514"]
[{"$nulls":4},"1118498518"]
[{"$nulls":4},"9781118498484"]
[{"$nulls":4},"1118498488"]
[{"$nulls":4},"9781299188235"]
[{"$nulls":4},"1299188230"]
[{"$nulls":4},"9781118498507"]
[{"$nulls":4},"111849850X"]
[null,null,"Edizione",null,"[1st edition]"]
[null,null,"Descrizione fisica",null,"1 online resource (257 p.)"]
[null,null,"Collana",null,"Royal Microscopical Society-John Wiley series"]
[null,null,"Classificazione",null,"SCI047000"]
[null,null,"Disciplina",null,"502.8/25"]
[null,null,"Soggetti",null,"Electron microscopy - Technique"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Cover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; References"]
[{"$nulls":4},"Chapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; References"]
[{"$nulls":4},"Chapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation "]
[{"$nulls":4},"Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging"]
[{"$nulls":4},"5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 Summary"]
[{"$nulls":4},"AcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index"]
[null,null,null,"Sommario/riassunto","\"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before\"--"]