LEADER 00851cam0 22002653 450 001 SOB020355 005 20200623151213.0 100 $a20040211d1978 |||||ita|0103 ba 101 $aita 102 $aIT 200 1 $aSydney Pollack$fFranco La Polla 210 $aFirenze$cLa Nuova Italia$d1978 215 $a136 p.$d16 cm 225 2 $aIl Castoro cinema$v52 410 1$1001LAEC00016618$12001 $a*Il Castoro cinema$v52 700 1$aLa_Polla$b, Franco$3AF00006487$4070$0438491 801 0$aIT$bUNISOB$c20200623$gRICA 850 $aUNISOB 852 $aUNISOB$j791.43|Coll|2|K$m114512 912 $aSOB020355 940 $aM 102 Monografia moderna SBN 941 $aM 957 $a791.43|Coll|2|K$b000058$gSI$d114512$rACQUISTO$1Spinosa$2UNISOB$3UNISOB$420200623151121.0$520200623151149.0$6Spinosa 996 $aSydney Pollack$970658 997 $aUNISOB LEADER 04585nam 22007335 450 001 996466316203316 005 20200702063042.0 010 $a3-030-16148-X 024 7 $a10.1007/978-3-030-16148-4 035 $a(CKB)4100000007823498 035 $a(DE-He213)978-3-030-16148-4 035 $a(MiAaPQ)EBC5921797 035 $a(PPN)23566832X 035 $a(EXLCZ)994100000007823498 100 $a20190322d2019 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAdvances in Knowledge Discovery and Data Mining$b[electronic resource] $e23rd Pacific-Asia Conference, PAKDD 2019, Macau, China, April 14-17, 2019, Proceedings, Part I /$fedited by Qiang Yang, Zhi-Hua Zhou, Zhiguo Gong, Min-Ling Zhang, Sheng-Jun Huang 205 $a1st ed. 2019. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019. 215 $a1 online resource (XL, 627 p. 310 illus., 146 illus. in color.) 225 1 $aLecture Notes in Artificial Intelligence ;$v11439 300 $aIncludes index. 311 $a3-030-16147-1 330 $aThe three-volume set LNAI 11439, 11440, and 11441 constitutes the thoroughly refereed proceedings of the 23rd Pacific-Asia Conference on Knowledge Discovery and Data Mining, PAKDD 2019, held in Macau, China, in April 2019. The 137 full papers presented were carefully reviewed and selected from 542 submissions. The papers present new ideas, original research results, and practical development experiences from all KDD related areas, including data mining, data warehousing, machine learning, artificial intelligence, databases, statistics, knowledge engineering, visualization, decision-making systems, and the emerging applications. They are organized in the following topical sections: classification and supervised learning; text and opinion mining; spatio-temporal and stream data mining; factor and tensor analysis; healthcare, bioinformatics and related topics; clustering and anomaly detection; deep learning models and applications; sequential pattern mining; weakly supervised learning; recommender system; social network and graph mining; data pre-processing and feature selection; representation learning and embedding; mining unstructured and semi-structured data; behavioral data mining; visual data mining; and knowledge graph and interpretable data mining. 410 0$aLecture Notes in Artificial Intelligence ;$v11439 606 $aArtificial intelligence 606 $aData mining 606 $aApplication software 606 $aOptical data processing 606 $aComputer security 606 $aArtificial Intelligence$3https://scigraph.springernature.com/ontologies/product-market-codes/I21000 606 $aData Mining and Knowledge Discovery$3https://scigraph.springernature.com/ontologies/product-market-codes/I18030 606 $aInformation Systems Applications (incl. Internet)$3https://scigraph.springernature.com/ontologies/product-market-codes/I18040 606 $aImage Processing and Computer Vision$3https://scigraph.springernature.com/ontologies/product-market-codes/I22021 606 $aComputer Appl. in Social and Behavioral Sciences$3https://scigraph.springernature.com/ontologies/product-market-codes/I23028 606 $aSystems and Data Security$3https://scigraph.springernature.com/ontologies/product-market-codes/I28060 615 0$aArtificial intelligence. 615 0$aData mining. 615 0$aApplication software. 615 0$aOptical data processing. 615 0$aComputer security. 615 14$aArtificial Intelligence. 615 24$aData Mining and Knowledge Discovery. 615 24$aInformation Systems Applications (incl. Internet). 615 24$aImage Processing and Computer Vision. 615 24$aComputer Appl. in Social and Behavioral Sciences. 615 24$aSystems and Data Security. 676 $a006.3 702 $aYang$b Qiang$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aZhou$b Zhi-Hua$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aGong$b Zhiguo$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aZhang$b Min-Ling$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aHuang$b Sheng-Jun$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a996466316203316 996 $aAdvances in Knowledge Discovery and Data Mining$9772012 997 $aUNISA LEADER 04604nam 2200625 450 001 9910144717503321 005 20230421044544.0 010 $a1-281-84293-1 010 $a9786611842932 010 $a3-527-61595-4 010 $a3-527-61594-6 035 $a(CKB)1000000000377534 035 $a(EBL)481965 035 $a(OCoLC)289076492 035 $a(SSID)ssj0000207935 035 $a(PQKBManifestationID)11188728 035 $a(PQKBTitleCode)TC0000207935 035 $a(PQKBWorkID)10238670 035 $a(PQKB)10651621 035 $a(MiAaPQ)EBC481965 035 $a(EXLCZ)991000000000377534 100 $a20160820h19941994 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aNanoscale characterization of surfaces and interfaces /$fN. John DiNardo 210 1$aWeinheim, [Germany] :$cVCH,$d1994. 210 4$dİ1994 215 $a1 online resource (176 p.) 300 $aDescription based upon print version of record. 311 $a3-527-29247-0 320 $aIncludes bibliographical references. 327 $aNanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control 327 $a2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy 327 $a3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; 3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces 327 $a4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References 330 $aDerived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.Topics include:Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charg 606 $aSurfaces (Physics) 606 $aScanning tunneling microscopy 606 $aNanotechnology 615 0$aSurfaces (Physics) 615 0$aScanning tunneling microscopy. 615 0$aNanotechnology. 676 $a530.427 676 $a620.44 700 $aDiNardo$b N. John$0522033 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910144717503321 996 $aNanoscale characterization of surfaces and interfaces$9835145 997 $aUNINA