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100   $a20090727d2001    ||||0itac50      ba
101 | $aeng
102   $aus
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aˆAn ‰introduction to mixed-signal IC test and measurement$fMark Burns, Gordon W. Roberts
210   $aNew York$aOxford$cOxford University Press$d2001
215   $aXX, 684 p.$cill.$d25 cm.
225 | $aˆThe ‰Oxford series in electrical and computer engineering
410  0$1001PUV0323958$12001 $aˆThe ‰Oxford series in electrical and computer engineering
606   $aCircuiti integrati$2FIR$3CFIC002586$9E
676   $a621.3815$9ELETTRONICA. COMPONENTI E CIRCUITI$v14
676   $a621.3815$9$v22
696   $aChip$aCircuiti elettronici integrati
699   $aCircuiti integrati$yChip
699   $aCircuiti integrati$yCircuiti elettronici integrati
700  1$aBurns$b, Mark$f <1962-    >$3UBOV564213$4070$0771937
701  1$aRoberts$b, Gordon W.$3RMSV005939$4070$0770532
801  3$aIT$bIT-000000$c20090727
850   $aIT-BN0095          
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912   $aUBO1468583
950  0$aBiblioteca Centralizzata di Ateneo$c1 v. in due copie$d 01SALA DING 621.3815                BUR.in$e 0102 0000055305  VMA A4(bis                1 v. (2. copia)$fY $h20050111$i20121019$c1 v. in due copie$d 01SALA DING 621.3815                BUR.in$e 0102 0000056455  VMA                       1 v.$fY $h20050301$i20050301
977   $a 01
996   $aIntroduction to mixed-signal IC test and measurement$91575656
997   $aUNISANNIO