LEADER 01001nam0 2200301 450 001 000001703 005 20080618154452.0 010 $a0-387-90886-2 100 $a20000918d1983----km-y0itay50------ba 101 1 $aeng$cger 102 $aUS 200 1 $a<>new cosmos$fAlbrecht Unsöld, Bodo Baschek$gtranslated by R. C. Smith based on the translation by W. H. McCrea of the 1st edition 205 $a3. revised and enlarged edition 210 $aNew York$aBerlin [etc.]$cSpringer-Verlag$d1983c 215 $a[7], 479 p.$cill.$d25 cm 225 2 $aHeidelberg Science Library 410 0$12001$aHeidelberg Science Library 454 0$a<>neue kosmos$12001$951723 610 1 $aAstronomia 676 $a523 700 1$aUnsöld,$bAlbrecht$051034 701 1$aBaschek,$bBodo$053396 702 1$aSmith,$bRobert C. 801 0$aIT$bUNIPARTHENOPE$gRICA$2UNIMARC 912 $a000001703 951 $aP1 523-N/1$b28922$cPIST$d20000921 996 $aNeue kosmos$951723 997 $aUNIPARTHENOPE LEADER 02059nam0 22004453i 450 001 UBO1411905 005 20251003044420.0 010 $a0792379918$bhdbk acid-free 100 $a20100726d2000 ||||0itac50 ba 101 | $aeng$ceng 102 $aus 181 1$6z01$ai $bxxxe 182 1$6z01$an 183 1$6z01$anc$2RDAcarrier 200 1 $aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$fMichael L. Bushnell, Vishwani D. Agrawal 210 $aBoston [etc.]$cKluwer Academic$dc2000 215 $aXVIII, 690 p.$d26 cm. 225 | $aFrontiers in electronic testing$v17 410 0$1001UBO1411913$12001 $aFrontiers in electronic testing$v17 500 10$aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$3UBO4614825$9UBOV542324$91575653 606 $aCIRCUITI INTEGRATI$xPROVE$2FIR$3MILC113505$9I 606 $aCircuiti integrati VLSI$2FIR$3UFIC009287$9E 676 $a621.39$9INGEGNERIA DEGLI ELABORATORI$v14 676 $a621.395$9INGEGNERIA DEGLI ELABORATORI. CIRCUITERIA$v22 696 $aChip$aCircuiti elettronici integrati 696 $aCircuiti a larghissima scala di integrazione$aCircuiti VLSI 699 $aCircuiti integrati$yChip 699 $aCircuiti integrati$yCircuiti elettronici integrati 699 $aCircuiti integrati VLSI$yCircuiti a larghissima scala di integrazione 699 $aCircuiti integrati VLSI$yCircuiti VLSI 700 1$aBushnell$b, Michael Lee$f <1950- >$3UBOV542324$4070$0771935 701 1$aAgrawal$b, Vishwani D.$f <1943- >$3UBOV542325$4070$0771936 801 3$aIT$bIT-000000$c20100726 850 $aIT-BN0095 901 $bNAP 01$cSALA DING $n$ 912 $aUBO1411905 950 0$aBiblioteca Centralizzata di Ateneo$c1 v.$d 01SALA DING 621.39 BUS.es$e 0102 0000056375 VMA A4 1 v.$fY $h20050207$i20050207 977 $a 01 996 $aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$91575653 997 $aUNISANNIO