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101 | $aeng$ceng
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181  1$6z01$ai $bxxxe  
182  1$6z01$an
183  1$6z01$anc$2RDAcarrier
200 1 $aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$fMichael L. Bushnell, Vishwani D. Agrawal
210   $aBoston [etc.]$cKluwer Academic$dc2000
215   $aXVIII, 690 p.$d26 cm.
225 | $aFrontiers in electronic testing$v17
410  0$1001UBO1411913$12001 $aFrontiers in electronic testing$v17
500 10$aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$3UBO4614825$9UBOV542324$91575653
606   $aCIRCUITI INTEGRATI$xPROVE$2FIR$3MILC113505$9I
606   $aCircuiti integrati VLSI$2FIR$3UFIC009287$9E
676   $a621.39$9INGEGNERIA DEGLI ELABORATORI$v14
676   $a621.395$9INGEGNERIA DEGLI ELABORATORI. CIRCUITERIA$v22
696   $aChip$aCircuiti elettronici integrati
696   $aCircuiti a larghissima scala di integrazione$aCircuiti VLSI
699   $aCircuiti integrati$yChip
699   $aCircuiti integrati$yCircuiti elettronici integrati
699   $aCircuiti integrati VLSI$yCircuiti a larghissima scala di integrazione
699   $aCircuiti integrati VLSI$yCircuiti VLSI
700  1$aBushnell$b, Michael Lee$f <1950-    >$3UBOV542324$4070$0771935
701  1$aAgrawal$b, Vishwani D.$f <1943-    >$3UBOV542325$4070$0771936
801  3$aIT$bIT-000000$c20100726
850   $aIT-BN0095          
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950  0$aBiblioteca Centralizzata di Ateneo$c1 v.$d 01SALA DING 621.39                  BUS.es$e 0102 0000056375  VMA A4                    1 v.$fY $h20050207$i20050207
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996   $aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits$91575653
997   $aUNISANNIO