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001 UAN0144602
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010   $a0442006365
100   $a20100219d1993    ||||0itac50      ba
101 | $aeng
102   $aus
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aHigh frequency measurements and noise in electronic circuits$fDouglas c. Smith
210   $aBoston [etc.]$cKluwer$dc1993
215   $aXIV, 231 p.$cill.$d24 cm.
606   $aStrumenti elettronici per misure$2FIR$3CFIC101066$9I
676   $a621.3815$9ELETTRONICA. COMPONENTI E CIRCUITI$v14
676   $a621.381548$9INGEGNERIA ELETTRONICA. COMPONENTI E CIRCUITI. COMPONENTI PER PROVE E MISURE$v22
700  1$aSmith$b, Douglas Charles$f <1947-    >$3UANV001193$4070$0771851
801  3$aIT$bIT-NA0079$c20100219
850   $aIT-BN0095          
912   $aUAN0144602
950  0$aBiblioteca Centralizzata di Ateneo$b1 v.$c1 v.$d 01SALA DING 621.3815                SMI.hi$e 0102 0000044475    B A4                    1 v. (5. rist. 2001)$f3 $h20021105$i20021105
977   $a 01
996   $aHigh frequency measurements and noise in electronic circuits$91575437
997   $aUNISANNIO