LEADER 01616nam0 22003373i 450 001 RMS0019161 005 20251003044343.0 010 $a0023635266 100 $a20130827d1993 ||||0itac50 ba 101 | $aeng 102 $aus 181 1$6z01$ai $bxxxe 182 1$6z01$an 200 1 $aPspice and circuit analysis$fJohn Keown 205 $a2. ed 210 $aNew York$cMerrill ;Toronto$cMaxwell Macmillan Canada$aNew York [etc.]$cMaxwell Macmillan International$dİ1993 215 $aXIX, 562 p.$cill.$d24 cm. 225 | $aMerrill's international series in engineering technology 410 0$1001PUV0373976$12001 $aMerrill's international series in engineering technology 606 $aCircuiti elettrici$xAnalisi$xProgramma PSpice$2FIR$3LO1C138809$9I 606 $aMicroelaboratori elettronici$xProgramma PSpice$2FIR$3LO1C138812$9I 676 $a621.38150285$9Elettronica. Componenti e circuiti. Elaborazione dei dati$v14 676 $a621.38150285536$9Elettronica. Componenti e circuiti. Programmi specifici per microelaboratori$v22 801 3$aIT$bIT-000000$c20130827 850 $aIT-BN0095 901 $bNAP 01$cSALA DING $n$ 912 $aRMS0019161 950 0$aBiblioteca Centralizzata di Ateneo$c1 v. in due copie$d 01SALA DING 621.38150285 KEO.ps$e 0102 0000022135 VMF A4 1 v.$fY $h19960215$i19960215$c1 v. in due copie$d 01SALA DING 621.38150285 KEO.ps$e 0102 0000022185 VMA A4(bis 1 v. (2. copia)$fY $h19960215$i19960215 977 $a 01 996 $aPspice and circuit analysis$94402146 997 $aUNISANNIO