LEADER 01392nam2 22002893i 450 001 NAP0556943 005 20251003044255.0 010 $a9782889124039 100 $a20121214d2011 ||||0itac50 ba 101 | $aeng$afre 102 $ach 181 1$6z01$ai $bxxxe 182 1$6z01$an 200 1 $aˆPart 6: ‰IEC60679-6:2011$ePhase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines$einternational standard 210 $aGeneva: IEC$d2011 215 $a42 p.$d30 cm 300 $aPubblicazione a fogli mobili 461 1$1001NAP0556935$12001 $aIEC 60679$eQuartz crystal controlled oscillators of ossessed quality$eInternational standard$fInternational Electrotechnical Commission$v6 510 1 $aˆPartie 6: ‰IEC 60679-6:2011$eMéthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes direcrices pour l'application$eNorme internationale$9NAP0556947 710 02$aInternational electrotechnical commission$3PUVV266581$4070$07403 801 3$aIT$bIT-000000$c20121214 850 $aIT-BN0095 912 $aNAP0556943 950 2$aBiblioteca Centralizzata di Ateneo$cParte 6$d 01NORME IEC 60679$e 0102 0000095245 VMA A4(0006 Parte 6$fB $h20121213$i20121214 977 $a 01 996 $aIEC60679-6:2011$91573737 997 $aUNISANNIO