LEADER 01235nam0 22003373i 450 001 NAP0474792 005 20251003044253.0 010 $a0387294082$bhbk 010 $a9780387294087$bhbk 100 $a20091118d2006 ||||0itac50 ba 101 | $aeng 102 $anl 181 1$6z01$ai $bxxxe 182 1$6z01$an 200 1 $aAdvances in electronic testing$echallenges and methodologies$fedited by Dimitris Gizopoulos 210 $aDordrecht$cSpringer$dİ2006 215 $aXXI, 412 p.$cill.$d25 cm. 225 | $aFrontiers in electronic testing$v27 410 0$1001UBO1411913$12001 $aFrontiers in electronic testing$v27 606 $aCircuiti elettronici$2FIR$3CFIC006530$9E 676 $a621.3815$9ELETTRONICA. COMPONENTI E CIRCUITI$v14 676 $a621.3815$9$v22 702 1$aGizopoulos$b, Dimitris$3NAPV113054 801 3$aIT$bIT-000000$c20091118 850 $aIT-BN0095 901 $bNAP 01$cSALA DING $n$ 912 $aNAP0474792 950 0$aBiblioteca Centralizzata di Ateneo$c1 v.$d 01SALA DING 621.3815 ADVIET$e 0102 0000060435 VMA A4 1 v.$fY $h20061120$i20061120 977 $a 01 996 $aAdvances in electronic testing$91573394 997 $aUNISANNIO