LEADER 01795nam0 22003733i 450 
001 MIL0302563
005 20250131062554.0
010   $a0792395646
100   $a20091130d1995    ||||0itac50      ba
101 | $aeng
102   $aus
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aAnalog signal generation for Built-in-self-test of mixed-signal integrated circuits$fby Gordon W. Roberts, Albert K. Lu
210   $aBoston [etc.]$cKluwer Academic$dc1995
215   $aVIII, 122 p.$d23 cm
225 | $a˜The œKluwer international series in engineering and computer science. Analog circuits and signal processing$v312
300   $aBibliografia: P. 117-119.
410  0$1001MIL0135737$12001 $a˜The œKluwer international series in engineering and computer science. Analog circuits and signal processing$v312
606   $aCircuiti integrati$xProgettazione$2FIR$3NAPC221616$9I
606   $aCircuiti integrati$xProve$2FIR$3NAPC270102$9E
606   $aRivelatori$2FIR$3NAPC073284$9I
606   $aStrumenti elettronici per misure$2FIR$3CFIC101066$9I
676   $a621.3815$9ELETTRONICA. COMPONENTI E CIRCUITI$v14
676   $a621.381548$9INGEGNERIA ELETTRONICA. COMPONENTI E CIRCUITI. COMPONENTI PER PROVE E MISURE$v22
700  1$aRoberts$b, Gordon W.$3RMSV005939$4070$0770532
701  1$aLu$b, Albert K.$f <1969-    >$3MILV171247$4070$0770533
801  3$aIT$bIT-NA0079$c20091130
850   $aIT-BN0095          
912   $aMIL0302563
950  0$aBiblioteca Centralizzata di Ateneo$c1 v.$d 01SALA DING 621.3815                ROB.an$e 0102 0000028525    B A4                    1 v.$f3 $h19971212$i19971212
977   $a 01
996   $aAnalog signal generation for Built-in-self-test of mixed-signal integrated circuits$91572322
997   $aUNISANNIO