LEADER 01065nam--2200373---450- 001 990003622100203316 005 20120213113453.0 010 $a978-88-971220-9-8 035 $a000362210 035 $aUSA01000362210 035 $a(ALEPH)000362210USA01 035 $a000362210 100 $a20120213d2011----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $aa---||||001yy 200 1 $aDa Gramsci a Berlinguer$eil Novecento comunista sotto la Mole$fLorenzo Gianotti 210 $aTorino$cGraphot$d2011 215 $a186 p.$cill.$d21 cm 410 0$12001 454 0$12001 461 0$1001-------$12001 606 0 $aPartiti comunisti$yItalia$2BNCF 676 $a324.2450752 700 1$aGIANOTTI,$bLorenzo$0611541 801 0$aIT$bsalbc$gISBD 912 $a990003622100203316 951 $aX.3.B. 6340$b232022 L.M.$cX.3.B.$d00306446 959 $aBK 969 $aUMA 979 $aPASSARO$b90$c20120213$lUSA01$h1132 979 $aPASSARO$b90$c20120213$lUSA01$h1134 996 $aDa Gramsci a Berlinguer$91136747 997 $aUNISA LEADER 01777oam 2200541 450 001 9910716054103321 005 20210514110913.0 035 $a(CKB)5470000002517564 035 $a(OCoLC)785074313 035 $a(EXLCZ)995470000002517564 100 $a20120408j196903 ua 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aOn the resolution and image intensity of the field-ion microscope /$fby Victor G. Weizer and Americo F. Forestieri 210 1$aWashington, D.C. :$cNational Aeronautics and Space Administration,$dMarch 1969. 215 $a1 online resource (ii, 14 pages) $cillustrations 225 1 $aNASA/TN ;$vD-5125 300 $a"March 1969." 320 $aIncludes bibliographical references (pages 13-14). 606 $aMicroscopes$2nasat 606 $aPhotography$2nasat 606 $aField ion microscopes 606 $aImaging systems$xImage quality 606 $aField ion microscopes$2fast 606 $aImaging systems$xImage quality$2fast 615 7$aMicroscopes. 615 7$aPhotography. 615 0$aField ion microscopes. 615 0$aImaging systems$xImage quality. 615 7$aField ion microscopes. 615 7$aImaging systems$xImage quality. 700 $aWeizer$b Victor G.$01412505 702 $aForestieri$b Americo F. 712 02$aUnited States.$bNational Aeronautics and Space Administration, 801 0$bOCLCE 801 1$bOCLCE 801 2$bOCLCQ 801 2$bOCLCF 801 2$bOCLCQ 801 2$bCOP 801 2$bGPO 906 $aBOOK 912 $a9910716054103321 996 $aOn the resolution and image intensity of the field-ion microscope$93506213 997 $aUNINA LEADER 02264nam0 22004693i 450 001 AQ10003617 005 20251003044040.0 010 $a0387572201$bNew York 010 $a3540572201$bBerlin 100 $a20110922d1993 ||||0itac50 ba 101 | $aeng 102 $ade 181 1$6z01$ai $bxxxe 182 1$6z01$an 200 1 $aAdvances in cryptology-Auscrypt '92$eWorkshop on the Theory and Application of Cryptographic Techniques$eGold Coast, Queensland, Australia, December 13-16,1992$eproceedings$fJennifer Seberry, Yuliang Zheng (eds.) 210 $aBerlin [etc.]$cSpringer$d1993 215 $aXIII, 542 p.$d24 cm 225 | $aLecture notes in computer science$fedited by G. Goos and J. Hartmanis$v718 410 0$1001MIL0030703$12001 $aLecture notes in computer science$fedited by G. Goos and J. Hartmanis$v718$1702 1$aGoos$b, Gerhard$3AQ1V006441$4340 606 $aElaboratori elettronici$xProgrammi$xProtezione$xCongressi$2FIR$3NAPC257710$9I 606 $aCrittografia $xCongressi$2FIR$3NAPC257711$9I 676 $a005.8$9SICUREZZA DEI DATI$v14 676 $a005.82$9Programmazione dei computer, programmi, dati. Sicurezza dei dati. Criptaggio dei dati$v22 696 $aConvegni$aCongressi e convegni$aProgrammi didattici$aProgrammi scolastici$aPiani di lavoro 696 $aConvegni$aCongressi e convegni 699 $aCongressi$yConvegni 699 $aCongressi$yCongressi e convegni 699 $aProgrammi$yProgrammi didattici 699 $aProgrammi$yProgrammi scolastici 699 $aProgrammi$zPiani di lavoro 699 $aCongressi$yConvegni 699 $aCongressi$yCongressi e convegni 702 1$aZheng$b, Yuliang$3AQ1V016040$4340 702 1$aSeberry$b, Jennifer$3UFIV059170$4340 710 12$aWorkshop on the Theory and Application of Cryptographic Techniques$f <1992$e ; Gold Coast>$3AQ1V001935$4070$0714578 801 3$aIT$bIT-000000$c20110922 850 $aIT-BN0095 912 $aAQ10003617 950 0$aBiblioteca Centralizzata di Ateneo$c193 v.$d 01COLL. ING. LNCS$e 0102 0000012915 VMA FD718 v. 718$fY $h19940907$i20110922 977 $a 01 996 $aAdvances in cryptology-Auscrypt '92$91381908 997 $aUNISANNIO