LEADER 00913nam a2200217 i 4500
001 991004357337707536
005 20241211103259.0
008 241211s1999    ne a   frb    001 0 eng d
020   $a9036513979
040   $aBibl. Dip.le Aggr. Ingegneria Innovazione - Sez. IngegneriaInnovazione$beng$cSocioculturale Scs
041 0 $aeng
082 04$a621.3815$223
100 1 $aPetrescu, Violeta$01777884
245 10$aElectromigration induced stress, a study into current induced resistance changes in VLSI interconnects :$bproefschrift /$cVioleta Petrescu
260   $aNetherlands,$c1999
300   $a172 p. ;$c25 cm
650  4$aInterconnects (Integrated circuit technology)$xMaterials$vDissertations, Academic
650  4$aElectrodiffusion
912   $a991004357337707536
996   $aElectromigration induced stress, a study into current induced resistance changes in VLSI interconnects$94300017
997   $aUNISALENTO