LEADER 01047nam a22002531i 4500 001 991003696499707536 005 20040527133724.0 008 040802s1980 it |||||||||||||||||ita 035 $ab1311346x-39ule_inst 035 $aARCHE-106607$9ExL 040 $aBiblioteca Interfacoltà$bita$cA.t.i. Arché s.c.r.l. Pandora Sicilia s.r.l. 082 04$a475 100 1 $aZanetti, Antonio Maria$0489900 245 10$aVersioni latine :$bper il Liceo Classico - Scientifico e l'Istituto Magistrale /$cMaria Zanetti, Ida Fabbri 260 $aBologna :$bPaccagnella,$cstampa 1980 300 $a467 p. ;$c24 cm 650 4$aLingua latina$xGrammatica 700 1 $aFabbri, Ida$eauthor$4http://id.loc.gov/vocabulary/relators/aut$0734526 907 $a.b1311346x$b02-04-14$c05-08-04 912 $a991003696499707536 945 $aLE002 Fondo Giudici P 619$g1$iLE002G-14100$lle002$nC. 1$o-$pE0.00$q-$rn$so $t0$u0$v0$w0$x0$y.i13748294$z05-08-04 996 $aVersioni latine$91450212 997 $aUNISALENTO 998 $ale002$b05-08-04$cm$da $e-$fita$git $h0$i1 LEADER 02736nam 2200661 a 450 001 9910829931303321 005 20220504100358.0 010 $a1-283-14094-2 010 $a9786613140944 010 $a3-527-63694-3 010 $a3-527-63692-7 035 $a(CKB)3460000000003434 035 $a(EBL)822727 035 $a(SSID)ssj0000545047 035 $a(PQKBManifestationID)11386019 035 $a(PQKBTitleCode)TC0000545047 035 $a(PQKBWorkID)10554464 035 $a(PQKB)10592066 035 $a(MiAaPQ)EBC822727 035 $a(PPN)190187816 035 $a(EXLCZ)993460000000003434 100 $a20120111d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aSurface and thin film analysis$b[electronic resource] $ea compendium of principles, instrumentation, and applications /$fedited by Gernot Friedbacher and Henning Bubert 205 $a2nd ed. 210 $aWeinheim, Germany $cWiley-VCH$d2011 215 $a1 online resource (559 p.) 300 $aDescription based upon print version of record. 311 $a3-527-32047-4 320 $aIncludes bibliographical references and index. 327 $apt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy. 330 $aSurveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref 606 $aThin films$xSurfaces$xAnalysis 606 $aElectron spectroscopy 606 $aSpectrum analysis 606 $aPel·lícules fines$2thub 606 $aEspectroscòpia d'electrons$2thub 608 $aLlibres electrònics$2thub 615 0$aThin films$xSurfaces$xAnalysis. 615 0$aElectron spectroscopy. 615 0$aSpectrum analysis. 615 7$aPel·lícules fines 615 7$aEspectroscòpia d'electrons 676 $a530.4275 676 $a541.33 701 $aFriedbacher$b Gernot$01635511 701 $aBubert$b H$g(Henning)$0903323 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910829931303321 996 $aSurface and thin film analysis$93976339 997 $aUNINA