LEADER 01176nam a2200313 i 4500 001 991003378149707536 005 20021212150707.0 008 021015s|||| it ||| | ||| 020 $a8843014943 035 $ab1179852x-39ule_inst 035 $aLE02378773$9ExL 040 $aDip.to Studi Storici$bita 041 0 $aDip.to Studi Storici$bita 082 0 $a410.76 100 1 $aLuraghi Silvia 245 10$aEsercizi di linguistica /$cSilvia Luraghi, Anna M. Thornton, Miriam Voghera 260 $aRoma :$bCarocci,$cc2000 300 $a248 p. :$bill. ;$c22 cm. 490 0 $aUniversitą ;$v157 650 4$aLinguistica - Esercizi 700 1 $aThornton, Anna Maria$eauthor$4http://id.loc.gov/vocabulary/relators/aut$0466157 700 1 $aVoghera, Miriam 700 1 $aLuraghi, Silvia$eauthor$4http://id.loc.gov/vocabulary/relators/aut$0168914 907 $a.b1179852x$b27-04-17$c12-12-02 912 $a991003378149707536 945 $aLE023 410.76 LUG 1 1$g1$i2023000055649$lle023$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i12046413$z12-12-02 996 $aEsercizi di linguistica$91445811 997 $aUNISALENTO 998 $ale023$b01-01-02$cm$da $e-$feng$git $h0$i1 LEADER 03109nam 2200805 450 001 9910827817203321 005 20230803200313.0 010 $a1-5231-0054-0 010 $a3-11-038804-9 024 7 $a10.1515/9783110305012 035 $a(CKB)3280000000039051 035 $a(EBL)1663098 035 $a(SSID)ssj0001442185 035 $a(PQKBManifestationID)11952104 035 $a(PQKBTitleCode)TC0001442185 035 $a(PQKBWorkID)11418807 035 $a(PQKB)11712715 035 $a(MiAaPQ)EBC1663098 035 $a(DE-B1597)206822 035 $a(OCoLC)1013944366 035 $a(OCoLC)1037980219 035 $a(OCoLC)1041991856 035 $a(OCoLC)1046607630 035 $a(OCoLC)1047006569 035 $a(OCoLC)1049632202 035 $a(OCoLC)1054867552 035 $a(OCoLC)892709322 035 $a(DE-B1597)9783110305012 035 $a(Au-PeEL)EBL1663098 035 $a(CaPaEBR)ebr11010257 035 $a(CaONFJC)MIL808032 035 $a(OCoLC)896786490 035 $a(EXLCZ)993280000000039051 100 $a20150212h20142014 uy 0 101 0 $aeng 135 $aur|nu---|u||u 181 $ctxt 182 $cc 183 $acr 200 10$aStructure analysis of advanced nanomaterials $enanoworld by high-resolution electron microscopy /$fTakeo Oku 210 1$aBerlin, [Germany] ;$aBoston, [Massachusetts] :$cDe Gruyter,$d2014. 210 4$d©2014 215 $a1 online resource (180 p.) 300 $aDescription based upon print version of record. 311 $a3-11-030501-1 311 $a3-11-030472-4 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $tFront matter --$tPreface --$tContents --$t1 Introduction --$t2 Structure and principle of electron microscopes --$t3 Practice of HREM --$t4 Characterization by HREM --$t5 Electron diffraction analysis of nanostructured materials --$t6 HREM analysis of nanostructured materials --$tA Appendix --$tIndex 330 $aHigh-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. 606 $aTransmission electron microscopy 606 $aHigh resolution electron microscopy 606 $aNanostructured materials 606 $aStructural analysis (Engineering) 610 $aAdvanced Nanomaterials. 610 $aCrystallography. 610 $aIndustrial Application. 610 $aMaterials Science. 615 0$aTransmission electron microscopy. 615 0$aHigh resolution electron microscopy. 615 0$aNanostructured materials. 615 0$aStructural analysis (Engineering) 676 $a502.825 700 $aOku$b Takeo$01034899 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910827817203321 996 $aStructure analysis of advanced nanomaterials$93915360 997 $aUNINA