LEADER 03069cam a2200361Ii 4500 001 991003233999707536 008 070802s2005 ne a sb 001 0 eng d 020 $a9780120885152 020 $a0120885158 035 $ab13652795-39ule_inst 040 $aBibl. Dip.le Aggr. Ingegneria Innovazione - Sez. Ingegneria Innovazione$beng 082 04$a530.4175$222 100 1 $aKhomchenko, Alexander V.$0627410 245 10$aWaveguide spectroscopy of thin films$h[e-book] /$cAlexander V. Khomchenko 260 $aAmsterdam :$bElsevier,$c2005 300 $axv, 220 p. :$bill. ;$c24 cm 440 0$aThin films and nanostructures ;$vv. 33 504 $aIncludes bibliographical references (p. 207-217) and index 505 0 $aForeword -- -- Acknowledgements -- -- Contents -- -- Introduction -- -- 1. Interaction of light with matter -- -- 2. Spectroscopy of optical guided modes -- -- 3. New applications of the m-line technique for thin-film structure studying -- -- 4. Spatial Fourier spectroscopy of guided modes: measuring the thin-film parameters -- -- 5. Characterizations of thin films by prism coupling of leaky modes -- -- 6. Measurements of absorption spectra of thin films -- -- 7. Applications of waveguide spectroscopy techniques in sensor systems -- -- 8. Optical nonlinearity in thin films at low-intensity light -- -- 9. Optical nonlinearity in multilayer structures -- -- Bibliography -- -- Index 520 $aIn this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated 533 $aElectronic reproduction.$bAmsterdam :$cElsevier Science & Technology,$d2007.$nMode of access: World Wide Web.$nSystem requirements: Web browser.$nTitle from title screen (viewed on July 25, 2007).$nAccess may be restricted to users at subscribing institutions 650 0$aThin films$xSpectra 650 0$aThin films$xOptical properties 650 6$aCouches minces$xSpectre 650 6$aCouches minces$xPropriétés optiques 655 7$aElectronic books.$2local 776 1 $cOriginal$z0120885158$z9780120885152$w(OCoLC)63127460 856 40$3Referex$uhttp://www.sciencedirect.com/science/book/9780120885152$zAn electronic book accessible through the World Wide Web; click for information 907 $a.b13652795$b03-03-22$c24-01-08 912 $a991003233999707536 996 $aWaveguide spectroscopy of thin films$91212850 997 $aUNISALENTO 998 $ale026$b24-01-08$cm$d@ $e-$feng$gne $h0$i0