LEADER 01159nam0 22002653i 450 001 SUN0023804 005 20070514120000.0 010 $a04-7102-080-X 100 $a20040915d1994 |0engc50 ba 101 $aeng 102 $aUS 105 $a|||| ||||| 200 1 $aAnalysis of multiconductor transmission lines$fClayton R. Paul 210 $aNew York$aJohn Wiley and Sons$d1994 215 $aXVII, 559 p.$cill.$d24 cm$e1 floppy disk. 410 1$1001SUN0023841$12001 $aWiley series in microwave and optical engineering$1210 $aNew York$cWiley. 620 $aUS$dNew York$3SUNL000011 700 1$aPaul$b, Clayton R.$3SUNV014792$027758 712 $aWiley$3SUNV000201$4650 801 $aIT$bSOL$c20201005$gRICA 912 $aSUN0023804 950 $aUFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$d05CONS K V 064 $e05 2838 20040915 950 $aUFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$d05CONS K III 067 $e05 3175 20070216 996 $aAnalysis of multiconductor transmission lines$9331476 997 $aUNICAMPANIA LEADER 01233nam a2200277 i 4500 001 991003185659707536 008 040726s1995 it a 000 0 ita d 020 $a8820321920 035 $ab1303697x-39ule_inst 040 $aDip.to Matematica$beng 082 0 $a378.1664 084 $aAMS 00A07 245 00$aAlpha test 4 :$bmanuale di preparazione ai test di ammissione universitari per i corsi di laurea in: ingegneria, informatica, scienza dei materiali, scienze dell'informazione e per i diplomi universitari delle aree: ingegneristica, matematica, informatica, statistica 260 3 $aMilano :$bHoepli,$cc1995 300 $aviii, 534 p. :$bill. ;$c24 cm 440 0$aAlpha test 650 0$aUniversities and colleges$zItaly$xEntrance examinations 650 0$aUniversities and colleges$zItaly$xAdmission 650 0$aEducational tests and measurements$zItaly 650 0$aScholastic Aptitude Test$xEvaluation 907 $a.b1303697x$b21-09-06$c26-07-04 912 $a991003185659707536 945 $aLE013 00A ALP11 (1995)$g1$i2013000147536$lle013$og$pE28.92$q-$rl$s- $t0$u5$v0$w5$x0$y.i1383342x$z02-09-04 996 $aAlpha test 4$9287370 997 $aUNISALENTO 998 $ale013$b26-07-04$cm$da $e-$fita$git $h0$i0