LEADER 01152nam a22002771i 4500 001 991002508219707536 005 20030707074558.0 008 030925s1992 it |||||||||||||||||ita 020 $a8815034706 035 $ab12298517-39ule_inst 035 $aARCHE-034608$9ExL 040 $aBiblioteca Interfacoltà$bita$cA.t.i. Arché s.c.r.l. Pandora Sicilia s.r.l. 245 00$aConflitti nel mondo del lavoro /$c[a cura di Simona Cerutti e Carlo Poni] 260 $aBologna :$bIl mulino,$c1992 300 $aP. 362-608 ;$c21 cm 440 0$aQuaderni storici.$nNuova serie ;$v80 500 $aCorrisponde a: Quaderni storici, N. s., a. 27., f. 2, n. 80 (1992). 700 1 $aCerutti, Simona 700 1 $aPoni, Carlo 907 $a.b12298517$b02-04-14$c08-10-03 912 $a991002508219707536 945 $aLE002 SP 930/080$g1$i2002000234971$lle002$o-$pE0.00$q-$rl$so $t0$u0$v0$w0$x0$y.i1269311x$z08-10-03 945 $aLE023 Per. 900 QST $g1$lle023$o-$pE0.00$q-$rn$so $t0$u0$v0$w0$x0$y.i1384832x$z22-09-04 996 $aConflitti nel mondo del lavoro$9163588 997 $aUNISALENTO 998 $ale002$ale023$b08-10-03$cm$da $e-$fita$git $h0$i1 LEADER 01337nam 2200373 450 001 996574608903316 005 20230419225703.0 010 $a1-5386-4135-6 035 $a(CKB)4920000000250420 035 $a(NjHacI)994920000000250420 035 $a(EXLCZ)994920000000250420 100 $a20230419d2018 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2018 International Conference on Radiation Effects of Electronic Devices (ICREED) /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ :$cIEEE,$d2018. 215 $a1 online resource $cillustrations 311 $a1-5386-4136-4 320 $aIncludes bibliographical references. 517 $a2018 International Conference on Radiation Effects of Electronic Devices 606 $aElectronic apparatus and appliances$xEffect of radiation on 606 $aRadiation hardening 615 0$aElectronic apparatus and appliances$xEffect of radiation on. 615 0$aRadiation hardening. 676 $a621.38104 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a996574608903316 996 $a2018 International Conference on Radiation Effects of Electronic Devices (ICREED)$92508955 997 $aUNISA