LEADER 00944nam a2200253 i 4500
001 991002490889707536
005 20020503165949.0
008 000505s1925    it            ||| | ita  
035   $ab10372234-39ule_inst
035   $aEXGIL104758$9ExL
040   $aBiblioteca Interfacoltà$bita
082 0 $a294.382
100 1 $aBuddha, Gotama$0184635
245 12$aI discorsi di Gotamo Buddho del Maiihimanikayo /$cper la prima volta tradotti dal testo Pali da K. E. Neumann e G. De Lorenzo
260   $aBari :$bLaterza,$c1925
300   $aXXVIII, 550 p.
700 1 $aNeumann, K. E.
700 1 $aDe Lorenzo, G.
907   $a.b10372234$b02-04-14$c27-06-02
912   $a991002490889707536
945   $aLE002 St. X C 2$g1$i2002000696380$lle002$o-$pE0.00$q-$rn$so  $t0$u0$v0$w0$x0$y.i10435578$z27-06-02
996   $aDiscorsi di Gotamo Buddho del Maiihimanikayo$9203038
997   $aUNISALENTO
998   $ale002$b01-01-00$cm$da  $e-$fita$git $h2$i1

LEADER 01402oam  2200433zu 450 
001 9910145625903321
005 20241212215427.0
010   $a9781509092949
010   $a1509092943
035   $a(CKB)1000000000278334
035   $a(SSID)ssj0000454307
035   $a(PQKBManifestationID)12173435
035   $a(PQKBTitleCode)TC0000454307
035   $a(PQKBWorkID)10397793
035   $a(PQKB)10469411
035   $a(NjHacI)991000000000278334
035   $a(EXLCZ)991000000000278334
100   $a20160829d2006      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 00$a2006 IEEE International Conference on Microelectronic Test Structures
210 31$a[Place of publication not identified]$cI E E E$d2006
215   $a1 online resource (xiii, 229 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9781424401673 
311 08$a1424401674 
606   $aElectronic apparatus and appliances$xTesting$vCongresses
606   $aSemiconductors$xTesting$vCongresses
615  0$aElectronic apparatus and appliances$xTesting
615  0$aSemiconductors$xTesting
676   $a621.3810287
801  0$bPQKB
906   $aPROCEEDING
912   $a9910145625903321
996   $a2006 IEEE International Conference on Microelectronic Test Structures$92529740
997   $aUNINA