LEADER 01565nam a2200313 i 4500 001 991002077319707536 005 20020508190059.0 008 980507s1973 it ||| | ita 035 $ab10955793-39ule_inst 035 $aPARLA154090$9ExL 040 $aDip.to Filosofia$bita 082 0 $a195 111 2 $aConvegno internazionale sul tema: Campanella e Vico$d<1968 ;$cRoma>$0538204 245 10$aAtti del Convegno internazionale sul tema :$bStoria, Pedagogia e Filosofia della scienza :$ba celebrazione del centenario della nascita di Federico Enriques :$bPisa, Bologna e Roma, 7-12 ottobre 1971 /$cAccademia nazionale dei Lincei 260 $aRoma :$bAccademia nazionale dei Lincei,$c1973 300 $a313 p. ;$c27 cm. 490 0 $aProblemi attuali di scienza e di cultura. 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Co.$d2011 215 $a1 online resource (400 p.) 300 $aDescription based upon print version of record. 311 $a981-283-667-5 320 $aIncludes bibliographical references and index. 327 $aDedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index 330 $aThis book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. 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