LEADER 01458nam a2200325 i 4500
001 991001789879707536
008 060721s2003    nyua     b    001 0 eng d
020   $a0306472929
035   $ab1342760x-39ule_inst
040   $aDip.to Fisica$beng
082 0 $a502.825$221
084   $a53.0.692
084   $aLC QH212.S3
245 00$aScanning electron microscopy and x-ray microanalysis /$cJoseph I. Goldstein ... [et al.]
250   $a3rd ed.
260   $aNew York :$bKluwer Academic/Plenum,$cc2003
300   $axix, 689 p. :$bill. (some col.) ;$c26 cm. +$e1 CD-ROM (4 3/4 in.)
504   $aIncludes bibliographical references and index
650  0$aScanning electron microscopy
650  0$aX-ray microanalysis
700 1 $aGoldstein, Joseph
907   $a.b1342760x$b08-07-15$c21-07-06
912   $a991001789879707536
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996   $aScanning electron microscopy and x-ray microanalysis$9125909
997   $aUNISALENTO
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