LEADER 01166nam a2200313 i 4500
001 991001789629707536
008 060721s2002    gw a     b    001 0 eng d
020   $a3540437649 (alk. paper)
035   $ab13427581-39ule_inst
040   $aDip.to Fisica$beng
082 0 $a620.1/1299$221
084   $aLC TA417.23
084   $a53.7.18
100 1 $aFultz, Brent$0624062
245 10$aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe
250   $a2. ed.
260   $aBerlin ;$aNew York :$bSpringer,$cc2002
300   $axxi, 748 p. :$bill. ;$c24 cm
504   $aIncludes bibliographical references and index
650  0$aMaterials$xMicroscopy
650  0$aTransmission electron microscopy
650  0$aX-ray diffractometer
700 1 $aHowe, James M.
907   $a.b13427581$b21-09-06$c21-07-06
912   $a991001789629707536
945   $aLE006 53.7.18 FUL$g1$i2006000157858$lle006$op$pE82.95$q-$rl$s-  $t0$u7$v9$w7$x0$y.i14274279$z21-07-06
996   $aTransmission electron microscopy and diffractometry of materials$91097557
997   $aUNISALENTO
998   $ale006$b21-07-06$cm$da  $e-$feng$ggw $h0$i0