LEADER 01076nam a2200277 i 4500
001 991001754869707536
008 090910s2001    enka     b    001 0 eng d
020   $a0748409688
035   $ab14065046-39ule_inst
040   $aDip.to Ingegneria dell'Innovazione$beng
082 0 $a502.825$221
100 1 $aGoodhew, Peter J.$0477169
245 10$aElectron microscopy and analysis /$cPeter J. Goodhew, John Humphreys, Richard Beanland
250   $a3rd ed.
260   $aLondon ;$aNew York :$bTaylor & Francis,$c2001
300   $ax, 251 p. :$bill. ;$c24 cm
504   $aIncludes bibliographical references and index
650  4$aElectron microscopy
700 1 $aHumphreys, F. J.
700 1 $aBeanland, R.
907   $a.b14065046$b28-01-14$c14-06-12
912   $a991001754869707536
945   $aLE026 502.825 GOO 01.01 2001$g1$i2026000061122$lle026$nProf. Lovergine / Biblioteca$op$pE45.31$q-$rl$s-  $t4$u4$v1$w4$x0$y.i15422896$z14-06-12
996   $aElectron microscopy and analysis$9239805
997   $aUNISALENTO
998   $ale026$b10-09-09$cm$da  $e-$feng$genk$h0$i0