LEADER 03148nam  22005775  450 
001 9910298596303321
005 20200705115544.0
010   $a3-319-76385-7
024 7 $a10.1007/978-3-319-76385-9
035   $a(CKB)4100000003359461
035   $a(DE-He213)978-3-319-76385-9
035   $a(MiAaPQ)EBC5576938
035   $a(PPN)226699064
035   $a(EXLCZ)994100000003359461
100   $a20180412d2018      u|         0
101 0 $aeng
135   $aurnn|008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aMeasurement, Testing and Sensor Technology $eFundamentals and Application to Materials and Technical Systems /$fby Horst Czichos
205   $a1st ed. 2018.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018.
215   $a1 online resource (X, 213 p. 186 illus. in color.) 
311   $a3-319-76384-9 
320   $aIncludes bibliographical references and index.
327   $aFundamentals -- Materials and their characterization -- Technical Systems and their characterization.
330   $aThis book presents the principles, methods and techniques to characterize materials and technical systems. The book is organized with concise text-graphics compilations in three parts: The first part describes the fundamentals of measurement, testing and sensor technology, including a survey of sensor types for dimensional metrology, kinematics, dynamics, and temperature. It describes also microsensors and embedded sensors. The second part gives an overview of materials and explains the application of measurement, testing and sensor technology to characterize composition, microstructure, properties and performance of materials as well as deterioration mechanisms and reliability. The third part introduces the general systems theory for the characterization of technical systems, exemplified by mechatronic and tribological systems. It describes technical diagnostics for structural health monitoring and performance control. .
606   $aMaterials science
606   $aElectronics
606   $aMicroelectronics
606   $aMechatronics
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
606   $aMechatronics$3https://scigraph.springernature.com/ontologies/product-market-codes/T19030
615  0$aMaterials science.
615  0$aElectronics.
615  0$aMicroelectronics.
615  0$aMechatronics.
615 14$aCharacterization and Evaluation of Materials.
615 24$aElectronics and Microelectronics, Instrumentation.
615 24$aMechatronics.
676   $a620.11
700   $aCzichos$b Horst$4aut$4http://id.loc.gov/vocabulary/relators/aut$0769145
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910298596303321
996   $aMeasurement, Testing and Sensor Technology$91567656
997   $aUNINA

LEADER 00939nam a2200289 i 4500
001 991001513429707536
005 20250530132438.0
008 970503s1982    it a   er f   001 0 ita  
020   $a8806052934
035   $ab10859901-39ule_inst
035   $aLE02370460$9ExL
040   $aDip.to Studi Storici$bita
082 04$a709.02
100 1 $aSchapiro, Meyer$0132175
245 10$aArte romanica /$cMeyer Schapiro ; traduzione di Adriano Sofri
260   $aTorino :$bEinaudi,$c1982
300   $a409 p. ;$c21 cm.
490 0 $aSaggi ;$v641
650  4$aArte romanica
700 1 $aSofri, Adriano
740 0 $aRomanesque art orig
907   $a.b10859901$b23-02-17$c28-06-02
912   $a991001513429707536
945   $aLE023 709.02 SCH 1 1$g1$i2023000015087$lle023$o-$pE0.00$q-$rn$so$t0$u0$v0$w0$x0$y.i10969731$z28-06-02
996   $aRomanesque art$930716
997   $aUNISALENTO
998   $ale023$b01-01-97$cm$da$e-$fita$git$h0$i1