LEADER 04161nam 2200589 450 001 9910136943803321 005 20200520144314.0 010 $a1-119-02713-6 010 $a1-78785-141-9 010 $a1-119-02714-4 010 $a1-119-02712-8 035 $a(CKB)3710000000666981 035 $a(EBL)4529314 035 $a(MiAaPQ)EBC4529314 035 $a(DLC) 2016010035 035 $a(Au-PeEL)EBL4529314 035 $a(CaPaEBR)ebr11251459 035 $a(CaONFJC)MIL924557 035 $a(OCoLC)942611368 035 $a(PPN)231126069 035 $a(EXLCZ)993710000000666981 100 $a20160211d2016 uy| 0 101 0 $aeng 135 $aur|n|---||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 13$aAn essential guide to electronic material surfaces and interfaces /$fLeonard J. Brillson, Ohio State University 210 1$aHoboken, New Jersey :$cJohn Wiley & Sons, Incorporated,$d2016. 215 $a1 online resource (379 p.) 300 $aDescription based upon print version of record. 311 $a1-119-02711-X 320 $aIncludes bibliographical references and index. 327 $aWhy surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces. 330 $a"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"--$cProvided by publisher. 606 $aElectronics$xMaterials 606 $aSurfaces (Technology)$xAnalysis 606 $aSpectrum analysis 606 $aSemiconductors$xMaterials 615 0$aElectronics$xMaterials. 615 0$aSurfaces (Technology)$xAnalysis. 615 0$aSpectrum analysis. 615 0$aSemiconductors$xMaterials. 676 $a621.381 700 $aBrillson$b L. J.$0886877 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910136943803321 996 $aAn essential guide to electronic material surfaces and interfaces$91980558 997 $aUNINA LEADER 01245nam a2200313 i 4500 001 991001307719707536 005 20020507114153.0 008 970308s1975 us ||| | eng 035 $ab10202432-39ule_inst 035 $aLE00645586$9ExL 040 $aDip.to Fisica$bita 084 $a53(082.2) 084 $a53.3.4 084 $a53.3.5 111 2 $aDaresbury Study Weekend$0462368 245 10$aThree particle phase shift analysis and meson resonance production :$bproceedings of the Daresbury Study Weekend, 1-2 February, 1975 /$cedited by J.B. Dainton and A.J.G. Hey 260 $aDaresbury :$bDaresbury Nuclear Physics Laboratory,$c1975 300 $avi, 141 p. :$bill. ;$c30 cm. 490 0 $aDaresbury Study Weekend ;$v8 490 0 $aDL/R ;$v34 650 4$aParticles (Nuclear physics)$xCongresses 700 1 $aDainton, J.B. 700 1 $aHey, Anthony J.G. 907 $a.b10202432$b17-02-17$c27-06-02 912 $a991001307719707536 945 $aLE006 53(042+082.2) DAR$g1$i2006000032759$lle006$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i10250281$z27-06-02 996 $aThree particle phase shift analysis and meson resonance production$9192517 997 $aUNISALENTO 998 $ale006$b01-01-97$cm$da $e-$feng$gus $h0$i1