LEADER 01125nam a2200325 i 4500 001 991001229779707536 005 20020507185635.0 008 950727s1976 us ||| | eng 020 $a0471007943 035 $ab1081873x-39ule_inst 035 $aLE01309035$9ExL 040 $aDip.to Matematica$beng 082 0 $a541.3453 084 $aAMS 76D10 100 1 $aAdamson, Arthur W.$06 245 10$aPhysical chemistry of surfaces /$cArthur W. Adamson 250 $a3rd ed 260 $aNew York :$c1976 300 $axviii, 698 p. :$bill. ;$c24 cm. 500 $a"A Wiley-Interscience publication." 500 $aIncludes bibliographies and index 650 4$aIncompressible viscous fluids 650 4$aPhysical and theoretical chemistry-mathematics 650 4$aSurface chemistry 907 $a.b1081873x$b21-09-06$c28-06-02 912 $a991001229779707536 945 $aLE013 76D ADA11 (1976)$g1$i2013000033556$lle013$o-$pE0.00$q-$rl$s- $t0$u2$v1$w2$x0$y.i10925491$z28-06-02 996 $aPhysical chemistry of surfaces$9126487 997 $aUNISALENTO 998 $ale013$b01-01-95$cm$da $e-$feng$gus $h0$i1 LEADER 02714oas 2201009 a 450 001 9910144488503321 005 20251106213014.0 011 $a1934-7944 035 $a(DE-599)ZDB2322600-6 035 $a(OCoLC)61313848 035 $a(CONSER) 2006216286 035 $a(CKB)991042729735336 035 $a(EXLCZ)99991042729735336 100 $a20050822a19849999 sy a 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aOptoelectronics, instrumentation, and data processing 210 $aNew York, N.Y. $cAllerton Press 210 3$aJersey City, NJ :$cSpringer Nature 300 $aRefereed/Peer-reviewed 311 08$a8756-6990 606 $aElectronic measurements$vPeriodicals 606 $aOptoelectronics$vPeriodicals 606 $aMeasurement$vPeriodicals 606 $aMesures e?lectroniques$vPe?riodiques 606 $aMesure$vPe?riodiques 606 $aOptoe?lectronique$vPe?riodiques 606 $aElectronic measurements$2fast$3(OCoLC)fst00907353 606 $aMeasurement$2fast$3(OCoLC)fst01715944 606 $aOptoelectronics$2fast$3(OCoLC)fst01046921 606 $aOptoelectrònica$2thub 606 $aMesuraments electrònics$2thub 608 $aperiodicals.$2aat 608 $aPeriodicals.$2fast 608 $aPeriodicals.$2lcgft 608 $aPe?riodiques.$2rvmgf 608 $aRevistes electròniques.$2thub 615 0$aElectronic measurements 615 0$aOptoelectronics 615 0$aMeasurement 615 6$aMesures e?lectroniques 615 6$aMesure 615 6$aOptoe?lectronique 615 7$aElectronic measurements. 615 7$aMeasurement. 615 7$aOptoelectronics. 615 7$aOptoelectrònica. 615 7$aMesuraments electrònics. 676 $a621.38/0414 712 02$aAkademii?a? nauk SSSR.$bSibirskoe otdelenie, 801 0$bOCLCS 801 1$bOCLCS 801 2$bOCLCS 801 2$bNSD 801 2$bOCLCQ 801 2$bDLC 801 2$bOCLCQ 801 2$bCUS 801 2$bOCLCQ 801 2$bOCLCA 801 2$bOCLCF 801 2$bOCLCO 801 2$bOCLCQ 801 2$bUKMGB 801 2$bVT2 801 2$bCNTRU 801 2$bDLC 801 2$bUBY 801 2$bDLC 801 2$bOCLCQ 801 2$bU3W 801 2$bOCLCQ 801 2$bAUD 801 2$bSXB 801 2$bUAB 801 2$bOCLCL 801 2$bW2U 801 2$bSFB 801 2$bQGK 801 2$bOCLCQ 906 $aJOURNAL 912 $a9910144488503321 996 $aOptoelectronics, instrumentation, and data processing$91931230 997 $aUNINA