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008 970308s1975    us            ||| | eng  
035   $ab10182597-39ule_inst
035   $aLE00643198$9ExL
040   $aDip.to Fisica$bita
084   $a53.0.64
084   $a53.0.692
084   $a502.8
084   $aGH212
100 1 $aYakowitz, H.$019726
245 10$aPractical scanning electron microscopy :$belectron and ion microprobe analysis /$cedited J.I. Goldstein and H. Yakowitz ; foreword by T.E. Everhart
260   $aNew York :$bPlenum Press,$c1975
300   $axviii, 582 p. :$bill. ;$c24 cm.
650  4$aMicroprobe analysis
650  4$aScanning electron microscope
700 1 $aGoldstein, Joseph I.
700 1 $aEverhart, T.E.
907   $a.b10182597$b21-09-06$c27-06-02
912   $a991001163649707536
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996   $aPractical scanning electron microscopy$9190644
997   $aUNISALENTO
998   $ale006$b01-01-97$cm$da  $e-$feng$gus $h0$i2