LEADER 01097nam a2200301 i 4500
001 991000863039707536
005 20020507102449.0
008 960523s1973    ne            ||| | eng  
020   $a0444104623
035   $ab1014013x-39ule_inst
035   $aLE00638161$9ExL
040   $aDip.to Fisica$bita
084   $a53.7.16
084   $a548'.842'02854
084   $aQD921
100 1 $aHead, A.K.$0461439
245 10$aComputed electron micrographs and defect identification /$cA.K. Head...[et al.]
260   $aAmsterdam :$bNorth-Holland Publ. Co.,$c1973
300   $ax, 400 p. :$bill. ;$c23 cm.
490 0 $aDefects in crystalline solids ;$v7
650  4$aElectron microscopy-Data processing
650  4$aMetals-Defects-Data processing
907   $a.b1014013x$b17-02-17$c27-06-02
912   $a991000863039707536
945   $aLE006 53.7.16 HEA$g1$i2006000059190$lle006$o-$pE0.00$q-$rl$s-  $t0$u0$v0$w0$x0$y.i10166385$z27-06-02
996   $aComputed electron micrographs and defect identification$9186657
997   $aUNISALENTO
998   $ale006$b01-01-96$cm$da  $e-$feng$gne $h0$i1