LEADER 01868nas  22005413a 450 
001 996581544903316
005 20221226232106.0
011   $a1558-4550
035   $a(OCoLC)61124036
035   $a(CKB)110978977982856
035   $a(CONSER)--2005212476
035   $a(EXLCZ)99110978977982856
100   $a20050722b19951996  s--            a
101 0 $aeng
135   $aurun|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aConference record /$fAutotestcon
210   $a[New York, N.Y.] $cInstitute of Electrical and Electronics Engineers
300   $aEach vol. has also a distinctive title.
311   $a1088-7725 
517 1 $aSystems Readiness: Test Technology for the 21st Century. Conference Record
517 1 $aIEEE Autotestcon
531   $aAUTOTESTCON CONFERENCE RECORD
531   $aCONFERENCE RECORD
531 0 $aConf. rec. - Autotestcon
606   $aAutomatic test equipment$vCongresses
606   $aMaintainability (Engineering)$vCongresses
606   $aAvionics$vCongresses
606   $aAutomatic test equipment$2fast$3(OCoLC)fst01432130
606   $aAvionics$2fast$3(OCoLC)fst00824383
606   $aMaintainability (Engineering)$2fast$3(OCoLC)fst01006137
608   $aConference papers and proceedings.$2fast
615  0$aAutomatic test equipment
615  0$aMaintainability (Engineering)
615  0$aAvionics
615  7$aAutomatic test equipment.
615  7$aAvionics.
615  7$aMaintainability (Engineering)
676   $a629
712 02$aInstitute of Electrical and Electronics Engineers.
712 02$aIEEE Instrumentation and Measurement Society.
712 02$aIEEE Aerospace and Electronic Systems Society.
906   $aCONFERENCE
912   $a996581544903316
996   $aConference record$91885971
997   $aUNISA