LEADER 01317nam 2200361 450 001 996577953503316 005 20230808204327.0 010 $a1-5090-1507-8 035 $a(CKB)4100000008867423 035 $a(WaSeSS)IndRDA00120300 035 $a(EXLCZ)994100000008867423 100 $a20200316d2016 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIOLTS $e2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design : 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain /$fsponsored by IEEE Council on Electronic Design Automation 210 1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2016. 215 $a1 online resource (102 pages) 311 $a1-5090-1508-6 606 $aError-correcting codes (Information theory)$vCongresses 606 $aElectronic circuit design$vCongresses 615 0$aError-correcting codes (Information theory) 615 0$aElectronic circuit design 676 $a512.00285 712 02$aIEEE Council on Electronic Design Automation, 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a996577953503316 996 $aIOLTS$92499062 997 $aUNISA