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100   $a20230415d2020      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2020 IEEE International Conference On Artificial Intelligence Testing $e3-6 August 2020, Oxford, United Kingdom : proceedings /$fFranz Wotawa [and eight-six others]
210  1$aPistacaway, New Jersey :$cIEEE,$d2020.
215   $a1 online resource (x, 141 pages) $cillustrations
300   $aIncludes index.
311   $a1-7281-6985-2 
327   $aMessage from the General Chair viii -- Message from the Program Co-Chairs ix -- Committees -- Images -- Autonomous Vehicles -- Metamorphic Testing -- Data -- ML for Testing (I) -- ML for Testing (II) -- Evaluation of ML Algorithms -- Author Index.
517   $a2020 IEEE International Conference On Artificial Intelligence Testing 
606   $aArtificial intelligence$vCongresses
615  0$aArtificial intelligence
676   $a006.3
700   $aWotawa$b Franz$01350795
801  0$bNjHacI
801  1$bNjHacl
906   $aPROCEEDING
912   $a996575638203316
996   $a2020 IEEE International Conference On Artificial Intelligence Testing$93089795
997   $aUNISA