LEADER 01283nam  2200349   450 
001 996575519503316
005 20230415024147.0
010   $a1-7281-8187-9
035   $a(CKB)5410000000003404
035   $a(NjHacI)995410000000003404
035   $a(EXLCZ)995410000000003404
100   $a20230415d2020      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) /$fInstitute of Electrical and Electronics Engineers
210  1$a[Place of publication not identified] :$cInstitute of Electrical and Electronics Engineers,$d2020.
215   $a1 online resource
311   $a1-7281-8188-7 
330   $aOn Line Testing and Robust Electronic System Design.
517   $a2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design 
606   $aRobust statistics$vCongresses
615  0$aRobust statistics
676   $a519.5
801  0$bNjHacI
801  1$bNjHacl
906   $aPROCEEDING
912   $a996575519503316
996   $a2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)$92505070
997   $aUNISA