LEADER 01201nam  2200313   450 
001 996575457503316
005 20231209100007.0
010   $a1-5044-5975-X
035   $a(CKB)4100000009070607
035   $a(NjHacI)994100000009070607
035   $a(EXLCZ)994100000009070607
100   $a20231209d2019      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 /$fInstitute of Electrical and Electronics Engineers
210  1$a[Place of publication not identified] :$cIEEE,$d2019.
215   $a1 online resource (48 pages)
606   $aAutomatic test equipment
615  0$aAutomatic test equipment.
676   $a621.381548
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a996575457503316
996   $a1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505$92582250
997   $aUNISA