LEADER 01337nam  2200373   450 
001 996574608903316
005 20230419225703.0
010   $a1-5386-4135-6
035   $a(CKB)4920000000250420
035   $a(NjHacI)994920000000250420
035   $a(EXLCZ)994920000000250420
100   $a20230419d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2018 International Conference on Radiation Effects of Electronic Devices (ICREED) /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, NJ :$cIEEE,$d2018.
215   $a1 online resource $cillustrations
311   $a1-5386-4136-4 
320   $aIncludes bibliographical references.
517   $a2018 International Conference on Radiation Effects of Electronic Devices 
606   $aElectronic apparatus and appliances$xEffect of radiation on
606   $aRadiation hardening
615  0$aElectronic apparatus and appliances$xEffect of radiation on.
615  0$aRadiation hardening.
676   $a621.38104
801  0$bNjHacI
801  1$bNjHacl
906   $aPROCEEDING
912   $a996574608903316
996   $a2018 International Conference on Radiation Effects of Electronic Devices (ICREED)$92508955
997   $aUNISA