LEADER 04003nam 22006375 450 001 996508664103316 005 20230124120045.0 010 $a3-030-86174-0 024 7 $a10.1007/978-3-030-86174-2 035 $a(MiAaPQ)EBC7186264 035 $a(Au-PeEL)EBL7186264 035 $a(CKB)26050263100041 035 $a(DE-He213)978-3-030-86174-2 035 $a(PPN)267810385 035 $a(EXLCZ)9926050263100041 100 $a20230123d2022 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aTheory and Practice of Thermal Transient Testing of Electronic Components$b[electronic resource] /$fedited by Marta Rencz, Gábor Farkas, András Poppe 205 $a1st ed. 2022. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2022. 215 $a1 online resource (389 pages) 311 08$aPrint version: Rencz, Marta Theory and Practice of Thermal Transient Testing of Electronic Components Cham : Springer International Publishing AG,c2023 9783030861735 320 $aIncludes bibliographical references and index. 327 $aIntroduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements. 330 $aThis book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices. 606 $aElectronics 606 $aElectric power production 606 $aElectronic circuits 606 $aMaterials 606 $aElectronics and Microelectronics, Instrumentation 606 $aElectrical Power Engineering 606 $aElectronic Circuits and Systems 606 $aMaterials Engineering 615 0$aElectronics. 615 0$aElectric power production. 615 0$aElectronic circuits. 615 0$aMaterials. 615 14$aElectronics and Microelectronics, Instrumentation. 615 24$aElectrical Power Engineering. 615 24$aElectronic Circuits and Systems. 615 24$aMaterials Engineering. 676 $a621.381 702 $aFarkas$b Ga?bor 702 $aPoppe$b Andra?s 702 $aRencz$b M$g(Marta), 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a996508664103316 996 $aTheory and Practice of Thermal Transient Testing of Electronic Components$93091260 997 $aUNISA