LEADER 06076nam 2200757 a 450 001 9910139612403321 005 20230725050917.0 010 $a1-119-97990-0 010 $a1-283-20457-6 010 $a9786613204578 010 $a1-119-97884-X 010 $a1-119-97885-8 035 $a(CKB)2550000000043053 035 $a(EBL)693217 035 $a(OCoLC)751695083 035 $a(SSID)ssj0000529387 035 $a(PQKBManifestationID)12200145 035 $a(PQKBTitleCode)TC0000529387 035 $a(PQKBWorkID)10552903 035 $a(PQKB)11124748 035 $a(MiAaPQ)EBC693217 035 $a(Au-PeEL)EBL693217 035 $a(CaPaEBR)ebr10488537 035 $a(CaONFJC)MIL320457 035 $a(EXLCZ)992550000000043053 100 $a20110510d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aAberration-corrected analytical transmission electron microscopy$b[electronic resource] /$fedited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks 210 $aHoboken, N.J. $cWiley$d2011 215 $a1 online resource (306 p.) 225 1 $aRMS - Royal Microscopical Society 300 $aDescription based upon print version of record 311 $a0-470-51851-0 320 $aIncludes bibliographical references and index. 327 $aAberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons 327 $a2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 327 $a3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 327 $a5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 327 $a6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 327 $a6.4.2 Implementation of the Scanning System 330 $a"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. 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This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--$cProvided by publisher. 330 $a"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--$cProvided by publisher. 410 0$aRMS - Royal Microscopical Society 606 $aTransmission electron microscopy 606 $aAberration 606 $aAchromatism 615 0$aTransmission electron microscopy. 615 0$aAberration. 615 0$aAchromatism. 676 $a502.8/25 676 $a502.825 686 $aSCI053000$2bisacsh 701 $aBrydson$b Rik$0961352 701 $aBrooks$b Susan$0961353 712 02$aRoyal Microscopical Society (Great Britain) 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910139612403321 996 $aAberration-corrected analytical transmission electron microscopy$92179570 997 $aUNINA LEADER 04679nam 22006255 450 001 996500668303316 005 20231110232615.0 010 $a3-11-073319-6 024 7 $a10.1515/9783110733198 035 $a(CKB)5580000000489485 035 $a(DE-B1597)575077 035 $a(DE-B1597)9783110733198 035 $a(MiAaPQ)EBC7152270 035 $a(Au-PeEL)EBL7152270 035 $a(EXLCZ)995580000000489485 100 $a20230103h20222022 fg 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aThinking the Re-Thinking of the World $eDecolonial Challenges to the Humanities and Social Sciences from Africa, Asia and the Middle East /$fed. by Kai Kresse, Abdoulaye Sounaye 210 1$aBerlin ;$aBoston : $cDe Gruyter, $d[2022] 210 4$dİ2022 215 $a1 online resource (VIII, 230 p.) 225 0 $aZMO-Studien : Studien des Leibniz-Zentrum Moderner Orient ;$v43 311 $a3-11-073809-0 327 $tFrontmatter -- $tContents -- $tAcknowledgements -- $tIntroduction: ?Thinking the Re-Thinking of the World? as Urgent and Necessary Process -- $tSouth and North, East and West -- $tContesting Northern Hegemony in Knowledge-Making in the Arts, Humanities, and Social Sciences -- $tSovereignty and Ascendancy -- $tKnowledge and Power in Sociology -- $tC. A. Diop?s Decolonising Historiography -- $tDecentring the Grand Narrative of the Enlightenment -- $tThe P?rva-Pak?a of Modern Indian Thought -- $tList of Contributors 330 $aAs far too many intellectual histories and theoretical contributions from the ?global South? remain under-explored, this volume works towards redressing such imbalance. Experienced authors, from the regions concerned, along different disciplinary lines, and with a focus on different historical timeframes, sketch out their perspectives of envisaged transformations. This includes specific case studies and reflexive accounts from African, South Asian, and Middle Eastern contexts. Taking a critical stance on the ongoing dominance of Eurocentrism in academia, the authors present their contributions in relation to current decolonial challenges. Hereby, they consider intellectual, practical and structural aspects and dimensions, to mark and build their respective positions. From their particular vantage points of (trans)disciplinary and transregional engagement, they sketch out potential pathways for addressing the unfinished business of conceptual decolonization. The specific individual positionalities of the contributors, which are shaped by location and regional perspective as much as in disciplinary, biographical, linguistic, religious, and other terms, are hereby kept in view. Drawing on their significant experiences and insights gained in both the global north and global south, the contributors offer original and innovative models of engagement and theorizing frames that seek to restore and critically engage with intellectual practices from particular regions and transregional contexts in Africa, South Asia, and the Middle East. 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