LEADER 04470nam 2200433 450 001 996483071403316 005 20231110214738.0 010 $a9783031089817$b(electronic bk.) 010 $z9783031089800 035 $a(MiAaPQ)EBC7047977 035 $a(Au-PeEL)EBL7047977 035 $a(CKB)24272700600041 035 $a(PPN)263898903 035 $a(EXLCZ)9924272700600041 100 $a20230104d2022 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aContactless system for measurement and evaluation of machined surfaces /$fJuraj Ruz?barsky? 210 1$aCham, Switzerland :$cSpringer,$d[2022] 210 4$d©2022 215 $a1 online resource (105 pages) 225 1 $aSpringerBriefs in Applied Sciences and Technology 311 08$aPrint version: Ru?barský, Juraj Contactless System for Measurement and Evaluation of Machined Surfaces Cham : Springer International Publishing AG,c2022 9783031089800 327 $aIntro -- Preface -- Introduction -- Contents -- Symbols and Abbreviations -- 1 Current State of the Art -- 1.1 Surface Roughness -- 1.2 Machined Surface Characteristics -- 1.2.1 Quality of Machined Surface Area -- 1.2.2 Theoretical and Actual Surface Roughness -- 1.2.3 Geometric Surface Waviness -- 1.3 Quality Parameters -- 1.3.1 Evaluation of Surface Character -- 1.4 Measurement of Machined Surface Roughness -- 1.4.1 Roughness Measurement Methods -- 1.4.2 Roughness Measurement Devices and Methods -- 1.5 Contact Methods of Roughness Measurement -- 1.5.1 Measruement System MAHR MarSurf PS1 -- 1.5.2 Measuring Instrument CarlZeiss Handysurf E-35A -- 1.6 Contactless Methods of Roughness Measurement -- 1.6.1 Measurement by Laser Sensor -- 1.6.2 Measurement System MAHR MarSurf WS 1 -- 1.6.3 Measuring Instrument Taylor Hobson CCI HD -- 1.7 Laser Profilometry LPM -- 1.7.1 Laser -- 1.7.2 Laser Light Color and Performance -- 1.8 Basic Components of Experimental Set-Ups of Optical 3D Methods -- 1.8.1 Point and Linear Optical Structures -- 1.8.2 Planar Optical Structures -- 1.8.3 Intensity Optical Structures -- 1.8.4 Applied Optical Detectors -- 1.8.5 CCD Detectors -- 1.8.6 CMOS Detectors -- 1.9 Overview of Applied 3D Methods -- 1.9.1 Laser Triangulation -- 1.9.2 Fourier Profilometry -- 1.9.3 Phase Shifting Profilometry -- 1.9.4 Phase Measuring Deflectometry -- 1.9.5 Moiré Topography -- 1.9.6 White Light Interferometry -- 1.9.7 Fizeau Interferometry -- 1.10 Comparison of Parameters of Equipment Applied in Surface Roughness Measurement -- References -- 2 Laser Profilometer Design -- 2.1 Frame Structure -- 2.2 Micrometric Slide -- 2.3 Objective -- 2.4 CMOS Camera -- 2.5 Applied Laser -- 2.6 Lighting -- 2.7 LPM View Software -- 2.8 General Characteristics of the LPM System -- References -- 3 Production of Experimental Samples. 327 $a3.1 Material Characteristics of Proposed Samples -- 3.2 Production of Samples by AWJ Technology -- References -- 4 Description of Measuring Experiment -- 4.1 Measurement of Selected Roughness Parameters by Contact Method -- 4.2 Measurement of Selected Roughness Parameters by Contactless Method -- 5 Measurement of Roughness Parameters by Contact Surface Roughness Tester -- 5.1 Samples with Declared Roughness of Ra = 6.3 ?m (AL120, SS050, FS050) -- 5.2 Samples with Declared Roughness of Ra = 12.5 ?m (AL220, SS120, FS100) -- 5.3 Samples with Declared Roughness of Ra = 25 ?m (AL370, SS150, FS150) -- 6 Measurement of Roughness Parameters by Contactless Laser Profilometer LPM -- 6.1 Samples with Declared Roughness of Ra = 6.3 ?m (AL120, SS050, FS050) -- 6.2 Samples with Declared Roughness of Ra = 12.5 ?m (AL220, SS120, FS100) -- 6.3 Samples with Declared Roughness of Ra = 25 ?m (AL370, SS150, FS150) -- 7 Glossy Surface Measurement -- 7.1 Comparison of Achieved Results by Contact and Contactless Roughness Surface Testers -- Reference -- 8 Conclusion -- Uncited References. 410 0$aSpringerBriefs in Applied Sciences and Technology 606 $aIndustrial management 615 0$aIndustrial management. 676 $a658.5 700 $aRuz?barsky?$b Juraj$0766968 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 912 $a996483071403316 996 $aContactless System for Measurement and Evaluation of Machined Surfaces$92903581 997 $aUNISA