LEADER 04496nam 22008055 450 001 996465436603316 005 20200701080641.0 010 $a3-540-44522-6 024 7 $a10.1007/3-540-44522-6 035 $a(CKB)1000000000211287 035 $a(SSID)ssj0000321005 035 $a(PQKBManifestationID)11256880 035 $a(PQKBTitleCode)TC0000321005 035 $a(PQKBWorkID)10262832 035 $a(PQKB)10841210 035 $a(DE-He213)978-3-540-44522-7 035 $a(MiAaPQ)EBC3073364 035 $a(PPN)15518573X 035 $a(EXLCZ)991000000000211287 100 $a20121227d2000 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt 182 $cc 183 $acr 200 10$aAdvances in Pattern Recognition$b[electronic resource] $eJoint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings /$fedited by Francesc J. Ferri, Jose M. Inesta, Adnan Amin, Pavel Pudil 205 $a1st ed. 2000. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2000. 215 $a1 online resource (XXXVI, 904 p.) 225 1 $aLecture Notes in Computer Science,$x0302-9743 ;$v1876 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a3-540-67946-4 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aInvited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session. 330 $aThis book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection. 410 0$aLecture Notes in Computer Science,$x0302-9743 ;$v1876 606 $aPattern recognition 606 $aOptical data processing 606 $aApplication software 606 $aComputer graphics 606 $aArtificial intelligence 606 $aPattern Recognition$3https://scigraph.springernature.com/ontologies/product-market-codes/I2203X 606 $aImage Processing and Computer Vision$3https://scigraph.springernature.com/ontologies/product-market-codes/I22021 606 $aComputer Applications$3https://scigraph.springernature.com/ontologies/product-market-codes/I23001 606 $aComputer Graphics$3https://scigraph.springernature.com/ontologies/product-market-codes/I22013 606 $aArtificial Intelligence$3https://scigraph.springernature.com/ontologies/product-market-codes/I21000 615 0$aPattern recognition. 615 0$aOptical data processing. 615 0$aApplication software. 615 0$aComputer graphics. 615 0$aArtificial intelligence. 615 14$aPattern Recognition. 615 24$aImage Processing and Computer Vision. 615 24$aComputer Applications. 615 24$aComputer Graphics. 615 24$aArtificial Intelligence. 676 $a006.4 702 $aFerri$b Francesc J$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aInesta$b Jose M$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aAmin$b Adnan$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aPudil$b Pavel$4edt$4http://id.loc.gov/vocabulary/relators/edt 712 02$aInternational Association for Pattern Recognition. 712 12$aInternational Workshop on Structural and Syntactic Pattern Recognition 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a996465436603316 996 $aAdvances in Pattern Recognition$91930086 997 $aUNISA