LEADER 01782nam  2200457   450 
001 996281136103316
005 20230803194719.0
010   $a1-4799-3929-3
035   $a(CKB)2560000000337422
035   $a(WaSeSS)IndRDA00096365
035   $a(WaSeSS)IndRDA00124057
035   $a(EXLCZ)992560000000337422
100   $a20200602d2014      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIPFA $eproceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore /$forganised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2014.
215   $a1 online resource (291 pages)
311   $a1-4799-3911-0 
311   $a1-4799-3931-5 
606   $aIntegrated circuits$xReliability$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aSemiconductors$xFailures$vCongresses
606   $aIntegrated circuits$xDefects$vCongresses
615  0$aIntegrated circuits$xReliability
615  0$aIntegrated circuits$xTesting
615  0$aSemiconductors$xFailures
615  0$aIntegrated circuits$xDefects
676   $a621.3815
712 02$aInstitute of Electrical and Electronics Engineers,
712 02$aIEEE Singapore Section.$bReliability/CPMT/EDS Chapter,
712 02$aIEEE Electron Devices Society,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996281136103316
996   $aIPFA$92524857
997   $aUNISA