LEADER 00937nam  2200313   450 
001 996281111003316
005 20180310105336.0
010   $a1-4799-2611-6
035   $a(CKB)3520000000004131
035   $a(WaSeSS)IndRDA00094290
035   $a(EXLCZ)993520000000004131
100   $a20180310d2014      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aVTS $e2014 IEEE 32nd VLSI Test Symposium : 13-17 April 2014
210  1$aNew York :$cIEEE,$d2014.
215   $a1 online resource (260 pages)
311   $a1-4799-2612-4 
606   $aIntegrated circuits$xVery large scale integration$xTesting$vCongresses
615  0$aIntegrated circuits$xVery large scale integration$xTesting
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996281111003316
996   $aVTS$92532188
997   $aUNISA