LEADER 02261nas 22006253 450 001 996281107403316 005 20230120003706.0 011 $a2378-2250 035 $a(OCoLC)61145658 035 $a(CKB)110978978384273 035 $a(CONSER)--2015202262 035 $a(EXLCZ)99110978978384273 100 $a20050726a19839999 --- a 101 0 $aeng 135 $aurun||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aProceedings /$fInternational Test Conference 210 1$a[Silver Spring, Md.] :$c[IEEE Computer Society Press] 210 21$aAltoona, PA :$cInternational Test Conference 210 31$aWashington, D.C. :$cInternational Test Conference 300 $aSome conferences also have distinctive titles. 300 $aPublished: Altoona, PA : International Test Conference, <1995-> 311 $a1089-3539 517 1 $aInternational Test Conference 517 1 $aITC 517 1 $aIEEE ... Test Conference 517 1 $aIEEE International Test Conference 517 1 $aProceedings of the International Test Conference 531 $aINTERNATIONAL TEST CONFERENCE PROCEEDINGS 531 $aINTERNATIONAL TEST CONFERENCE 531 0 $aProc. 606 $aComputer storage devices$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 606 $aSemiconductor storage devices$xTesting$vCongresses 606 $aComputer storage devices$2fast$3(OCoLC)fst00872634 606 $aIntegrated circuits$xTesting$2fast$3(OCoLC)fst00975593 606 $aSemiconductor storage devices$xTesting$2fast$3(OCoLC)fst01112185 608 $aPeriodicals.$2fast 608 $aConference papers and proceedings.$2fast 615 0$aComputer storage devices 615 0$aIntegrated circuits$xTesting 615 0$aSemiconductor storage devices$xTesting 615 7$aComputer storage devices. 615 7$aIntegrated circuits$xTesting. 615 7$aSemiconductor storage devices$xTesting. 676 $a004 676 $a004 712 02$aIEEE Computer Society. 712 02$aInstitute of Electrical and Electronics Engineers. 906 $aCONFERENCE 912 $a996281107403316 996 $aProceedings$957126 997 $aUNISA