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200 10$aIEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003) $eIEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits /$fIEEE
210  1$aNew York :$cIEEE,$d2014.
215   $a1 online resource (ix, 10 pages)
330   $aMethods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages. Keywords: IEEE C37.26, inductive test circuits, power factor.
517   $aC37.26-2014 - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage 
517   $aIEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003): IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
517   $aIEEE Std C37.26-2014 
517   $aIEEE Guide for Methods of Power-Factor Measurement for Low-Voltage 
606   $aElectric circuits$xStandards
615  0$aElectric circuits$xStandards.
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