LEADER 01768nam  2200337   450 
001 996281029903316
005 20231207111705.0
010   $a0-7381-3836-3
035   $a(CKB)3780000000090623
035   $a(NjHacI)993780000000090623
035   $a(EXLCZ)993780000000090623
100   $a20231207d2004      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Std C37.26-2003 (Revision of IEEE Std C37.26-1972):  $eIEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits /$fIEEE
210  1$aNew York, NY, :$cIEEE,$d2004.
215   $a1 online resource (vi, 10 pages)
330   $aThis guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.
517   $aIEEE Std C37.26-2003 
606   $aElectric circuits$xStandards
615  0$aElectric circuits$xStandards.
676   $a621.3192
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a996281029903316
996   $aIEEE Std C37.26-2003 (Revision of IEEE Std C37.26-1972)$93647208
997   $aUNISA