LEADER 01965nam 2200349 450 001 996280674103316 005 20231206214110.0 010 $a1-5044-0297-9 024 7 $a10.1109/IEEESTD.1971.7407578 035 $a(CKB)3710000000595636 035 $a(NjHacI)993710000000595636 035 $a(EXLCZ)993710000000595636 100 $a20231206d1971 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std 325-1971 (ANSI N42.8-1972) $eIEEE standard test procedures for germanium gamma-ray detectors /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cIEEE,$d1971. 215 $a1 online resource (20 pages) 330 $aGermanium detectors are extensively used for the detection and analysis of gamma-radiation primarily because of their excellent energy resolution. The rapid development and utilization of these detectors in a variety of technical disciplines have made standard test procedures desirable so that measurements may have the same meaning to all manufacturers and users.These test procedures are not intended to imply that all tests described herein are mandatory,but only that such tests as are carried out on completed devices should be performed in accordance with these recommended procedures. These test procedures are a supplement to the following documents: IEEE Std 300-1969, Test Procedure for Semiconductor Radiation Detectors, (ANSI N42.1-1969) and IEEE Std 301-1969, Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors, (ANSI N42.2-1969). 517 $aIEEE Std 325-1971 606 $aGamma rays$xMeasurement 615 0$aGamma rays$xMeasurement. 676 $a539.7 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a996280674103316 996 $aIEEE Std 325-1971 (ANSI N42.8-1972)$93647276 997 $aUNISA