LEADER 01768nam  2200373   450 
001 996280670603316
005 20231208090741.0
010   $a0-7381-4361-8
024 7 $a10.1109/IEEESTD.1976.120672
035   $a(CKB)3780000000092929
035   $a(NjHacI)993780000000092929
035   $a(EXLCZ)993780000000092929
100   $a20231208d1976      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Std 301-1976 /$fInstitute of Electrical and Electronics Engineer
210  1$a[Place of publication not identified] :$cIEEE,$d1976.
215   $a1 online resource (30 pages)
330   $aThis standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI N42.2-1969). The standard has been modified and refined based on the experience gained in using the earlier edition over a six-year period and taking into account advances in the technology. Improvements in preamplifier noise characteristics and pulse shaping techniques as well as increased utilization of integral detector-preamplifier assemblies have occurred in recent years.
517   $aIEEE Std 301-1976: IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation
606   $aAmplifiers (Electronics)
606   $aPower amplifiers
615  0$aAmplifiers (Electronics)
615  0$aPower amplifiers.
676   $a621.381535
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a996280670603316
996   $aIEEE Std 301-1976$92573556
997   $aUNISA