LEADER 01519nam 2200397 450 001 996280528003316 005 20230611130741.0 010 $a0-7381-3577-1 035 $a(CKB)1000000000035524 035 $a(NjHacI)991000000000035524 035 $a(EXLCZ)991000000000035524 100 $a20230611d2003 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Standard for Boundary-Scan Testing of Advanced Digital Networks $eIEEE Std 1149.6-2003 /$fIEEE Computer Society Test Technology Standards Committee, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board 210 1$aNew York, N.Y. :$cInstitute of Electrical and Electronics Engineers,$d2003. 215 $a1 online resource (vi, 132 pages) $cillustrations 311 $a0-7381-3576-3 320 $aIncludes bibliographical references. 517 $aIEEE Std 1149.6-2003 606 $aBoundary scan testing$xStandards 606 $aIntegrated circuits$xTesting$xStandards 615 0$aBoundary scan testing$xStandards. 615 0$aIntegrated circuits$xTesting$xStandards. 676 $a621.381531 712 02$aInstitute of Electrical and Electronics Engineers, 712 02$aIEEE-SA Standards Board, 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a996280528003316 996 $aIEEE Standard for Boundary-Scan Testing of Advanced Digital Networks$93383222 997 $aUNISA