LEADER 01352nam  2200385   450 
001 996280361303316
005 20230814225925.0
010   $a1-5386-5710-4
035   $a(CKB)4100000007125754
035   $a(WaSeSS)IndRDA00122103
035   $a(EXLCZ)994100000007125754
100   $a20200423d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2018 IEEE East-West Design & Test Symposium $e14-17 September 2018, Kazan, Russia /$fIEEE Computer Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018.
215   $a1 online resource (167 pages)
311   $a1-5386-5711-2 
606   $aElectrical engineering$xData processing$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
615  0$aElectrical engineering$xData processing
615  0$aElectronic circuits$xTesting
615  0$aElectronic digital computers$xCircuits$xTesting
676   $a621.30285
712 02$aIEEE Computer Society,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996280361303316
996   $a2018 IEEE East-West Design & Test Symposium$92509436
997   $aUNISA