LEADER 01728nas  2200481-a 450 
001 996280313503316
005 20200120053402.2
011   $a2157-1481
035   $a(OCoLC)467407101
035   $a(CKB)3400000000014938
035   $a(CONSER)--2009242494
035   $a(EXLCZ)993400000000014938
100   $a20091119a20099999  ---            a
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aInternational Conference on Measuring Technology and Mechatronics Automation $e[proceedings] : ICMTMA
210   $aLos Alamitos, Calif. $cIEEE Computer Society$dİ2009-
300   $aLatest issued consulted: Apr. 11/12, 2009 (IEEE Xplore, viewed Nov. 19, 2009).
311   $a2157-1473 
517 1 $aProceedings
517 1 $aMeasuring Technology and Mechatronics Automation, ICMTMA, International Conference on
517 3 $aICMTMA
517 3 $aMeasuring technology and mechatronics automation
531 0 $aInt. Conf. Meas. Technol. Mechatron. Autom.
606   $aMechatronics$vCongresses
606   $aMeasuring instruments$vCongresses
606   $aMeasuring instruments$2fast$3(OCoLC)fst01013181
606   $aMechatronics$2fast$3(OCoLC)fst01013514
608   $aConference papers and proceedings.$2fast
615  0$aMechatronics
615  0$aMeasuring instruments
615  7$aMeasuring instruments.
615  7$aMechatronics.
676   $a621.3
712 02$aIEEE Computer Society.
712 02$aChangsha li gong da xue.
906   $aCONFERENCE
912   $a996280313503316
996   $aInternational Conference on Measuring Technology and Mechatronics Automation$91889247
997   $aUNISA